Inventor · disambiguated record
Claus Dietrich
Also filed as: DIETRICH CLAUS
13 granted patents·7 pending applications·94 citations·filing 1997–2010
91Inventor score
Files withSUSS MICROTEC TEST SYS GMBH6SUSS MICROTEC TESTSYSTEMS GMBH5KARL SUSS DRESDEN GMBH2DIETRICH CLAUS1KANEV STOJAN1
Top patents by PatentIndex Score
20 records- 0175US6688156B2Tester for pressure sensorsKARL SUSS DRESDEN GMBH·Filed 2001·Granted Feb 10, 2004·21 cites·24 claims
- 0274US9110131B2Method and device for contacting a row of contact areas with probe tipsDIETRICH CLAUS·Filed 2010·Granted Aug 18, 2015·5 cites·19 claims
- 0369US7671615B2Method and apparatus for controlling the temperature of electronic componentsSUSS MICROTEC TECH SYSTEMS GMB·Filed 2007·Granted Mar 2, 2010·6 cites·25 claims
- 0468US7046025B2Test apparatus for testing substrates at low temperaturesSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2003·Granted May 16, 2006·13 cites·10 claims
- 0565US8094925B2Method for increasing the accuracy of the positioning of a first object relative to a second objectSCHNEIDEWIND STEFAN·Filed 2009·Granted Jan 10, 2012·5 cites·5 claims
- 0664US7196507B2Apparatus for testing substratesSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2004·Granted Mar 27, 2007·13 cites·11 claims
- 0763US7859278B2Probe holder for a probe for testing semiconductor componentsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Dec 28, 2010·4 cites·15 claims
- 0862US7579854B2Probe station and method for measurements of semiconductor devices under defined atmosphereSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·4 cites·21 claims
- 0962US7057408B2Method and prober for contacting a contact area with a contact tipSUSS MICROTEC TEST SYS GMBH·Filed 2004·Granted Jun 6, 2006·11 cites·13 claims
- 1055US7038441B2Test apparatus with loading deviceSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2003·Granted May 2, 2006·7 cites·20 claims
- 1151US8368413B2Method for testing electronic components of a repetitive pattern under defined thermal conditionsKANEV STOJAN·Filed 2009·Granted Feb 5, 2013·2 cites·12 claims
- 1251US2010045265A1Method and device for forming a temporary electrical contact to a solar cellSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 1346US2010011569A1Apparatus and method for assembling several semiconductor devices onto a target substrateSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 1444US2008298671A1Method For Increasing The Accuracy Of The Positioning Of A First Object Relative To A Second ObjectSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2008·Application pending·0 cites
- 1538US2010045264A1Probe for temporarily electrically contacting a solar cellSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 1638US2004208355A1Method for increasing the accuracy of the positioning of a first object relative to a second objectFiled 2004·Application pending·0 cites
- 1734US6864676B2Substrate-holding device for testing circuit arrangements on substratesSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2002·Granted Mar 8, 2005·0 cites·10 claims
- 1834US2004119492A1Method and apparatus for testing movement-sensitive substratesFiled 2003·Application pending·0 cites
- 1931US2005083037A1Arrangement and method for testing substrates under loadFiled 2004·Application pending·0 cites
- 2022US6373272B1Arrangement for the testing of semiconductor structuresKARL SUSS DRESDEN GMBH·Filed 1997·Granted Apr 16, 2002·3 cites·17 claims
Join the waitlist — get patent alerts
Get an alert when Claus Dietrich files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →