Inventor · disambiguated record
Roman Malendevich
Also filed as: MALENDEVICH ROMAN
9 granted patents·384 citations·filing 2004–2007
92Inventor score
Technology areasG02B
Files withLUXTERA INC9
Top patents by PatentIndex Score
9 records- 0196US7378861B1Optical alignment loops for the wafer-level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2007·Granted May 27, 2008·72 cites·33 claims
- 0295US7586608B1Wafer-level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2007·Granted Sep 8, 2009·35 cites·10 claims
- 0395US7224174B1Optical alignment loops for the wafer-level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2004·Granted May 29, 2007·52 cites·4 claims
- 0495US7183759B1Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2004·Granted Feb 27, 2007·54 cites·15 claims
- 0595US7024066B1Littrow gratings as alignment structures for the wafer level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2004·Granted Apr 4, 2006·91 cites·22 claims
- 0693US7262852B1Wafer-level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2005·Granted Aug 28, 2007·21 cites·17 claims
- 0792US7184626B1Wafer-level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2004·Granted Feb 27, 2007·34 cites·25 claims
- 0891US7412138B1Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2007·Granted Aug 12, 2008·17 cites·5 claims
- 0983US7298939B1Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chipsLUXTERA INC·Filed 2005·Granted Nov 20, 2007·8 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →