Inventor · disambiguated record
Jae-Hoon Joo
Also filed as: JOO JAE-HOON
21 granted patents·4 pending applications·155 citations·filing 1997–2023
94Inventor score
Top patents by PatentIndex Score
25 records- 0194US11926882B1Method for producing aqueous solution containing nickel or cobaltKOREA ZINC CO LTD·Filed 2023·Granted Mar 12, 2024·4 cites·22 claims
- 0283US5929696ACircuit for converting internal voltage of semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Jul 27, 1999·43 cites·12 claims
- 0380US2024286921A1Method for producing nickel sulfate solution for secondary battery from nickel cathodeKOREA ZINC CO LTD·Filed 2023·Application pending·0 cites
- 0479US12258282B2Method for producing nickel sulfate solution for secondary battery from nickel cathodeKOREA ZINC CO LTD·Filed 2023·Granted Mar 25, 2025·0 cites·1 claims
- 0576US7460428B2Dynamic random access memory and communications terminal including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 2, 2008·11 cites·21 claims
- 0669US8228736B2Mobile system on chip (SoC) and mobile terminal using the mobile SoC, and method for refreshing a memory in the mobile SoCJOO JAE HOON·Filed 2009·Granted Jul 24, 2012·6 cites·17 claims
- 0769US6111457AInternal power supply circuit for use in a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Aug 29, 2000·26 cites·15 claims
- 0868US8477553B2Fuse circuit and semiconductor device having the sameKANG SANG-SEOK·Filed 2011·Granted Jul 2, 2013·2 cites·19 claims
- 0967US6490222B2Decoding circuit for controlling activation of wordlines in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Dec 3, 2002·15 cites·13 claims
- 1066US2024368729A1Method for removing halide from waelz oxideKOREA ZINC CO LTD·Filed 2023·Application pending·0 cites
- 1165US12469579B2Semiconductor test apparatus capable of inducing reduction of power consumptionYC CORP·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 1261US12461142B2Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatusYC CORP·Filed 2023·Granted Nov 4, 2025·0 cites·18 claims
- 1357US7476983B2Semiconductor device including wire bonding pads and pad layout methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 13, 2009·2 cites·18 claims
- 1456US6215723B1Semiconductor memory device having sequentially disabling activated word linesSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Apr 10, 2001·9 cites·20 claims
- 1552US6438042B1Arrangement of bitline boosting capacitor in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Aug 20, 2002·7 cites·24 claims
- 1650US6345011B2Input/output line structure of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Feb 5, 2002·6 cites·3 claims
- 1747US10295564B2Apparatus for clamping a probe card and probe card including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 21, 2019·0 cites·18 claims
- 1844US5949724ABurn-in stress circuit for semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Sep 7, 1999·11 cites·14 claims
- 1940US6225818B1Integrated circuits including function identification circuits having operating modes that identify corresponding functions of the integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted May 1, 2001·10 cites·4 claims
- 2037US6522597B2Semiconductor memory device and bit line isolation gate arrangement method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Feb 18, 2003·1 cites·8 claims
- 2136US6396756B1Integrated circuit memory devices including transmission parts that are adjacent input/output selection partsSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted May 28, 2002·2 cites·16 claims
- 2234US2009044063A1Semiconductor memory device and test system of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 2333US6909654B2Bit line pre-charge circuit of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 21, 2005·0 cites·18 claims
- 2431US6473325B2Bit line sensing control circuit for a semiconductor memory device and layout of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 29, 2002·0 cites·19 claims
- 2531US2006132183A1Semiconductor deviceLIM DONG-JIN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →