Inventor · disambiguated record
Ichiro Kono
Also filed as: KONO ICHIRO
11 granted patents·4 pending applications·375 citations·filing 1981–2023
90Inventor score
Files withHONDA MOTOR CO LTD4HITACHI LTD3TERA PROBE INC3AOI ELECTRONICS CO LTD2SUMITOMO ELECTRIC INDUSTRIES2
Top patents by PatentIndex Score
15 records- 0194US6297674B1Semiconductor integrated circuit for low power and high speed operationHITACHI LTD·Filed 1999·Granted Oct 2, 2001·114 cites·6 claims
- 0293US6191764B1Method of driving display deviceCASIO COMPUTER CO LTD·Filed 1998·Granted Feb 20, 2001·143 cites·6 claims
- 0384USD277583SOptical fiber connectorSUMITOMO ELECTRIC INDUSTRIES·Filed 1984·Granted Feb 12, 1985·20 cites·1 claims
- 0484US4487474AOptical connector with ceramic plugs and sleeveSUMITOMO ELECTRIC INDUSTRIES·Filed 1981·Granted Dec 11, 1984·48 cites·3 claims
- 0582US6788105B2Semiconductor integrated circuitHITACHI LTD·Filed 2001·Granted Sep 7, 2004·29 cites·5 claims
- 0673US6515521B2Semiconductor integrated circuit for low power and high speed operationHITACHI LTD·Filed 2001·Granted Feb 4, 2003·16 cites·7 claims
- 0771US7984649B2Panel inspection apparatus and inspection methodHONDA MOTOR CO LTD·Filed 2008·Granted Jul 26, 2011·3 cites·5 claims
- 0867US10488300B2Vibration exciterHONDA MOTOR CO LTD·Filed 2017·Granted Nov 26, 2019·1 cites·4 claims
- 0963US9607861B2Semiconductor device and method of manufacturing the sameTERA PROBE INC·Filed 2016·Granted Mar 28, 2017·1 cites·10 claims
- 1052US2025185165A1Wiring board and method for manufacturing wiring boardAOI ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1151US11295533B2Product evaluation result display systemHONDA MOTOR CO LTD·Filed 2019·Granted Apr 5, 2022·0 cites·5 claims
- 1244US11521948B2Method of manufacturing semiconductor deviceAOI ELECTRONICS CO LTD·Filed 2019·Granted Dec 6, 2022·0 cites·12 claims
- 1339US2021294929A1Accuracy evaluation apparatus and accuracy evaluation methodHONDA MOTOR CO LTD·Filed 2021·Application pending·0 cites
- 1432US2015235845A1Method of manufacturing semiconductor deviceTERA PROBE INC·Filed 2015·Application pending·0 cites
- 1530US2015200166A1Semiconductor device, and manufacturing method of semiconductor deviceTERA PROBE INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →