Inventor · disambiguated record
Wei-Chun Tsai
Also filed as: TSAI WEI CHUN
15 granted patents·1 pending application·30 citations·filing 2011–2025
89Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD10TAIWAN SEMICONDUCTOR MFG2ACADEMIA SINICA1AVER INFORMATION INC1UNIV NAT TSING HUA1
Top patents by PatentIndex Score
16 records- 0189US10535573B2System and method for test key characterizing wafer processing stateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jan 14, 2020·4 cites·20 claims
- 0289US10032889B2Self-aligned passivation of active regionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 24, 2018·4 cites·20 claims
- 0389US9953975B2Methods for forming STI regions in integrated circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Apr 24, 2018·11 cites·20 claims
- 0486US9093335B2Calculating carrier concentrations in semiconductor Fins using probed resistanceTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Jul 28, 2015·5 cites·20 claims
- 0585US9627280B2Methods for probing semiconductor fins through four-point probe and determining carrier concentrationsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 18, 2017·3 cites·20 claims
- 0676US9412847B2Self-aligned passivation of active regionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 9, 2016·2 cites·20 claims
- 0764US10943995B2Self-aligned passivation of active regionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Mar 9, 2021·0 cites·20 claims
- 0863US10164070B2Self-aligned passivation of active regionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 25, 2018·0 cites·20 claims
- 0960US2025384692A1Conference image display method and video conference deviceAVER INFORMATION INC·Filed 2025·Application pending·0 cites
- 1057US10269666B2System and method for test key characterizing wafer processing stateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 23, 2019·0 cites·20 claims
- 1157US9431288B2System and method for test key characterizing wafer processing stateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 30, 2016·0 cites·20 claims
- 1255US12053777B2Devices and methods for detecting cancerous cellsACADEMIA SINICA·Filed 2019·Granted Aug 6, 2024·0 cites·4 claims
- 1355US9349659B2Methods for probing semiconductor fins and determining carrier concentrations thereinTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted May 24, 2016·0 cites·20 claims
- 1454US11450661B2Forming STI regions to separate semiconductor FinsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 20, 2022·0 cites·20 claims
- 1554US8460014B2Electronic device and pin thereofYEH CHANG-HSING·Filed 2011·Granted Jun 11, 2013·1 cites·14 claims
- 1650US11549946B2Method for detecting cholangiocarcinoma cellsUNIV NAT TSING HUA·Filed 2019·Granted Jan 10, 2023·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →