Inventor · disambiguated record
Yu-Po Tang
Also filed as: TANG YU-PO
20 granted patents·1 pending application·311 citations·filing 2010–2020
95Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD7TAIWAN SEMICONDUCTOR MFG6LIU GEORGE2CHENG NIAN-FUH1CHIANG CHIA-PING1
Top patents by PatentIndex Score
21 records- 0198US9716032B2Via-free interconnect structure with self-aligned metal line interconnectionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jul 25, 2017·48 cites·15 claims
- 0298US9390217B2Methodology of optical proximity correction optimizationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 12, 2016·68 cites·20 claims
- 0397US8631360B2Methodology of optical proximity correction optimizationWANG HUNG-CHUN·Filed 2012·Granted Jan 14, 2014·34 cites·19 claims
- 0493US8745550B2Fracture aware OPCCHENG NIAN-FUH·Filed 2012·Granted Jun 3, 2014·38 cites·15 claims
- 0592US8572520B2Optical proximity correction for mask repairCHOU CHIH-SHIANG·Filed 2012·Granted Oct 29, 2013·28 cites·18 claims
- 0692US8527916B1Dissection splitting with optical proximity correction to reduce corner roundingCHIANG CHIA-PING·Filed 2012·Granted Sep 3, 2013·38 cites·18 claims
- 0791US8381153B2Dissection splitting with optical proximity correction and mask rule check enforcementTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 19, 2013·21 cites·20 claims
- 0890US8431291B2Intensity selective exposure photomaskLIU GEORGE·Filed 2011·Granted Apr 30, 2013·5 cites·16 claims
- 0989US8779592B2Via-free interconnect structure with self-aligned metal line interconnectionsTANG YU-PO·Filed 2012·Granted Jul 15, 2014·14 cites·19 claims
- 1086US11048161B2Optical proximity correction methodology using pattern classification for target placementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 29, 2021·2 cites·20 claims
- 1184US9165095B2Target point generation for optical proximity correctionTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 20, 2015·4 cites·20 claims
- 1282US9189588B2Polygon-based optical proximity correctionTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 17, 2015·3 cites·20 claims
- 1380US10866397B2Microscope apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 15, 2020·2 cites·20 claims
- 1472US9026957B2Method of defining an intensity selective exposure photomaskTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted May 5, 2015·1 cites·15 claims
- 1570US8673520B2Intensity selective exposure photomaskLIU GEORGE·Filed 2011·Granted Mar 18, 2014·1 cites·19 claims
- 1668US11619806B2Microscope apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 4, 2023·0 cites·20 claims
- 1766US8806392B2Distinguishable IC patterns with encoded informationTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Aug 12, 2014·2 cites·20 claims
- 1865US8928973B2Microscope apparatus for phase image acquisitionCHU FU-SHENG·Filed 2011·Granted Jan 6, 2015·2 cites·20 claims
- 1959US10527928B2Optical proximity correction methodology using pattern classification for target placementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 7, 2020·0 cites·20 claims
- 2057US10295813B2Microscope apparatus and method for phase image acquisitionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 21, 2019·0 cites·20 claims
- 2138US2014123084A1System and Method for Improving a Lithography Simulation ModelTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →