Inventor · disambiguated record
Yuui Shimizu
Also filed as: SHIMIZU YUUI
36 granted patents·4 pending applications·301 citations·filing 2003–2021
97Inventor score
Top patents by PatentIndex Score
40 records- 0193US7116598B2Semiconductor memoryTOSHIBA KK·Filed 2005·Granted Oct 3, 2006·33 cites·20 claims
- 0292US11763890B2Semiconductor memory deviceKIOXIA CORP·Filed 2021·Granted Sep 19, 2023·2 cites·9 claims
- 0389US7791919B2Semiconductor memory device capable of identifying a plurality of memory chips stacked in the same packageTOSHIBA KK·Filed 2008·Granted Sep 7, 2010·22 cites·20 claims
- 0488US7965555B2Non-volatile semiconductor memory deviceTOSHIBA KK·Filed 2009·Granted Jun 21, 2011·19 cites·14 claims
- 0587US7869240B2Semiconductor device and semiconductor memory testerTOSHIBA KK·Filed 2008·Granted Jan 11, 2011·12 cites·8 claims
- 0687US7835210B2Magnetic random access memory and data read method of the sameTOSHIBA KK·Filed 2007·Granted Nov 16, 2010·19 cites·20 claims
- 0786US8374032B2Non-volatile semiconductor memory deviceTOSHIBA KK·Filed 2011·Granted Feb 12, 2013·10 cites·13 claims
- 0884US7869265B2Magnetic random access memory and write method of the sameTOSHIBA KK·Filed 2008·Granted Jan 11, 2011·15 cites·20 claims
- 0983US8730757B2Memory systemSHIMIZU YUUI·Filed 2012·Granted May 20, 2014·8 cites·17 claims
- 1082US7859881B2Magnetic memory device and write/read method of the sameTOSHIBA KK·Filed 2007·Granted Dec 28, 2010·19 cites·20 claims
- 1181US10762963B2Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Sep 1, 2020·4 cites·10 claims
- 1281US8179730B2Semiconductor device and semiconductor memory testerSHIMIZU YUUI·Filed 2010·Granted May 15, 2012·5 cites·10 claims
- 1380US7035137B2Semiconductor memory device having memory cells including ferromagnetic films and control method thereofTOSHIBA KK·Filed 2004·Granted Apr 25, 2006·27 cites·21 claims
- 1480US6950334B2Magnetic random access memory having test circuit and test method thereforTOSHIBA KK·Filed 2003·Granted Sep 27, 2005·28 cites·13 claims
- 1577US7864563B2Magnetic random access memoryTOSHIBA KK·Filed 2007·Granted Jan 4, 2011·10 cites·19 claims
- 1676US6999340B2Semiconductor memory device including reference memory cell and control methodTOSHIBA KK·Filed 2004·Granted Feb 14, 2006·23 cites·35 claims
- 1775US8736346B2Level shift circuitSHIMIZU YUUI·Filed 2012·Granted May 27, 2014·4 cites·18 claims
- 1875US8391040B2Nonvolatile semiconductor memory deviceSUZUKI YOSHINAO·Filed 2011·Granted Mar 5, 2013·5 cites·20 claims
- 1974US8531882B2Semiconductor memory device including a plurality of stacked semiconductor memory chipsFUJIMURA TOMOFUMI·Filed 2011·Granted Sep 10, 2013·8 cites·16 claims
- 2070US7907446B2Nonvolatile semiconductor memory device and method of driving the sameTOSHIBA KK·Filed 2008·Granted Mar 15, 2011·7 cites·19 claims
- 2164US11133066B2Semiconductor memory deviceKIOXIA CORP·Filed 2020·Granted Sep 28, 2021·0 cites·6 claims
- 2261US10340857B2Amplifier circuitTOSHIBA MEMORY CORP·Filed 2017·Granted Jul 2, 2019·1 cites·20 claims
- 2361US8861287B2Interface circuitSHIMIZU YUUI·Filed 2012·Granted Oct 14, 2014·2 cites·22 claims
- 2455US8558576B2Output bufferSHIMIZU YUUI·Filed 2011·Granted Oct 15, 2013·1 cites·14 claims
- 2554US7079414B2Magnetic random access memory deviceTOSHIBA KK·Filed 2004·Granted Jul 18, 2006·8 cites·31 claims
- 2650US9367076B2Semiconductor deviceTOSHIBA KK·Filed 2014·Granted Jun 14, 2016·0 cites·16 claims
- 2748US7154775B2Magnetic random access memoryTOSHIBA KK·Filed 2003·Granted Dec 26, 2006·5 cites·31 claims
- 2845US7095649B2Semiconductor integrated circuit deviceTOSHIBA KK·Filed 2004·Granted Aug 22, 2006·4 cites·20 claims
- 2941US9583582B2Semiconductor integrated deviceTOSHIBA KK·Filed 2014·Granted Feb 28, 2017·0 cites·8 claims
- 3041US8410811B2Input circuit and semiconductor storage deviceSHIMIZU YUUI·Filed 2011·Granted Apr 2, 2013·0 cites·20 claims
- 3140US2012069530A1Semiconductor device and method of manufacturing the sameINOUE SATOSHI·Filed 2011·Application pending·0 cites
- 3239US9076532B2Semiconductor memory device and method of testing the sameTOSHIBA KK·Filed 2013·Granted Jul 7, 2015·0 cites·22 claims
- 3338US2014285231A1Semiconductor device and trimming method for the sameTOSHIBA KK·Filed 2013·Application pending·0 cites
- 3437US9218859B2Semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Dec 22, 2015·0 cites·16 claims
- 3537US2014269107A1Semiconductor device, semiconductor memory device and method of controlling the sameTOSHIBA KK·Filed 2013·Application pending·0 cites
- 3636US8315108B2Memory interface circuitSHIMIZU YUUI·Filed 2010·Granted Nov 20, 2012·0 cites·20 claims
- 3736US7269045B2Magnetic random access memory with interconnected write linesTOSHIBA KK·Filed 2005·Granted Sep 11, 2007·0 cites·18 claims
- 3835US10121778B2Semiconductor deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Nov 6, 2018·0 cites·20 claims
- 3935US2007258282A1Magnetic memory device and method of writing data in the sameUEDA YOSHIHIRO·Filed 2007·Application pending·0 cites
- 4034US10431266B2Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2018·Granted Oct 1, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →