Inventor · disambiguated record
Michael G. Mcintyre
Also filed as: MCINTYRE MICHAEL · MCINTYRE MICHAEL G
17 granted patents·2 pending applications·350 citations·filing 1995–2024
94Inventor score
Files withADVANCED MICRO DEVICES INC12GLOBALFOUNDRIES INC2MCGEN ENTPR LLC1MCINTYRE MICHAEL1MCINTYRE MICHAEL G1
Top patents by PatentIndex Score
19 records- 0194US6297644B1Multipurpose defect test structure with switchable voltage contrast capability and method of useADVANCED MICRO DEVICES INC·Filed 1999·Granted Oct 2, 2001·135 cites·30 claims
- 0291US6362634B1Integrated defect monitor structures for conductive features on a semiconductor topography and method of useADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 26, 2002·60 cites·22 claims
- 0384US7533313B1Method and apparatus for identifying outlier dataADVANCED MICRO DEVICES INC·Filed 2006·Granted May 12, 2009·14 cites·24 claims
- 0480US7106897B1Universal spatial pattern recognition systemADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 12, 2006·27 cites·25 claims
- 0576US8041518B2Determining die test protocols based on process healthGLOBALFOUNDRIES INC·Filed 2007·Granted Oct 18, 2011·8 cites·23 claims
- 0673US7539552B2Method and apparatus for implementing a universal coordinate system for metrology dataADVANCED MICRO DEVICES INC·Filed 2006·Granted May 26, 2009·7 cites·22 claims
- 0771US7899634B1Method and apparatus for analysis of continuous data using binary parsingADVANCED MICRO DEVICES INC·Filed 2005·Granted Mar 1, 2011·3 cites·19 claims
- 0871US7862406B2Saw chain sharpening assemblyMCINTYRE MICHAEL·Filed 2006·Granted Jan 4, 2011·6 cites·20 claims
- 0969US5913105AMethod and system for recognizing scratch patterns on semiconductor wafersADVANCED MICRO DEVICES INC·Filed 1995·Granted Jun 15, 1999·48 cites·19 claims
- 1066US2025021897A1Generating predictions and/or other analyses using artificial intelligenceONTO INNOVATION INC·Filed 2024·Application pending·0 cites
- 1164US7583833B2Method and apparatus for manufacturing data indexingADVANCED MICRO DEVICES INC·Filed 2006·Granted Sep 1, 2009·8 cites·34 claims
- 1260US7195931B2Split manufacturing method for advanced semiconductor circuitsADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 27, 2007·9 cites·27 claims
- 1357US6063685ADevice level identification methodologyADVANCED MICRO DEVICES INC·Filed 1998·Granted May 16, 2000·24 cites·7 claims
- 1455US7236848B2Data representation relating to a non-sampled workpieceADVANCED MICRO DEVICES INC·Filed 2005·Granted Jun 26, 2007·1 cites·32 claims
- 1543US7822567B2Method and apparatus for implementing scaled device testsADVANCED MICRO DEVICES INC·Filed 2007·Granted Oct 26, 2010·0 cites·20 claims
- 1643US2003140434A1Sport ramp surface and methodFiled 2002·Application pending·0 cites
- 1742US12311992B2Method and apparatus for protecting walls from damage by wheeled cartsMCGEN ENTPR LLC·Filed 2021·Granted May 27, 2025·0 cites·18 claims
- 1842US7710137B2Method and apparatus for relative testing of integrated circuit devicesGLOBALFOUNDRIES INC·Filed 2007·Granted May 4, 2010·0 cites·21 claims
- 1940US8239151B2Method and apparatus for analysis of continuous data using binary parsingMCINTYRE MICHAEL G·Filed 2011·Granted Aug 7, 2012·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →