Inventor · disambiguated record
Keith Brankner
Also filed as: BRANKNER KEITH · BRANKNER KEITH J · BRANKNER KEITH JOHN
7 granted patents·267 citations·filing 1994–2004
87Inventor score
Top patents by PatentIndex Score
7 records- 0190US6882745B2Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD dataFREESCALE SEMICONDUCTOR INC·Filed 2002·Granted Apr 19, 2005·89 cites·15 claims
- 0289US7194709B2Automatic alignment of integrated circuit and design layout of integrated circuit to more accurately assess the impact of anomaliesBRANKNER KEITH JOHN·Filed 2004·Granted Mar 20, 2007·59 cites·69 claims
- 0382US6709793B1Method of manufacturing reticles using subresolution test patternsMOTOROLA INC·Filed 2002·Granted Mar 23, 2004·26 cites·15 claims
- 0479US5458732AMethod and system for identifying process conditionsTEXAS INSTRUMENTS INC·Filed 1994·Granted Oct 17, 1995·72 cites·34 claims
- 0551US6573194B2Method of growing surface aluminum nitride on aluminum films with low energy barrierTEXAS INSTRUMENTS INC·Filed 2001·Granted Jun 3, 2003·3 cites·9 claims
- 0643US6465339B2Technique for intralevel capacitive isolation of interconnect pathsTEXAS INSTRUMENTS INC·Filed 1998·Granted Oct 15, 2002·14 cites·9 claims
- 0732US5928964ASystem and method for anisotropic etching of silicon nitrideTEXAS INSTRUMENTS INC·Filed 1996·Granted Jul 27, 1999·4 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →