Inventor · disambiguated record
Naoki Ikeuchi
Also filed as: IKEUCHI NAOKI
13 granted patents·7 pending applications·165 citations·filing 1998–2008
92Inventor score
Top patents by PatentIndex Score
20 records- 0177US7383732B2Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structureOCTEC INC·Filed 2005·Granted Jun 10, 2008·11 cites·30 claims
- 0275US6931928B2Microstructure with movable massTOKYO ELECTRON LTD·Filed 2002·Granted Aug 23, 2005·18 cites·15 claims
- 0374US8082124B2Method and system for diagnosing abnormal plasma dischargeMIYANO TAKAYA·Filed 2007·Granted Dec 20, 2011·5 cites·15 claims
- 0473US7348788B2Probing card and inspection apparatus for microstructureTOKYO ELECTRON LTD·Filed 2006·Granted Mar 25, 2008·7 cites·25 claims
- 0572US8141426B2Displacement measurement apparatus for microstructure and displcement measurement method thereofIKEUCHI NAOKI·Filed 2008·Granted Mar 27, 2012·10 cites·16 claims
- 0671US7726190B2Device, method and program for inspecting microstructureTOKYO ELECTRON LTD·Filed 2006·Granted Jun 1, 2010·7 cites·12 claims
- 0771US6223601B1Vibration wave detecting method and vibration wave detectorSUMITOMO METAL IND·Filed 1999·Granted May 1, 2001·39 cites·21 claims
- 0863US6438243B1Vibration wave detectorSUMITOMO METAL IND·Filed 1998·Granted Aug 20, 2002·38 cites·23 claims
- 0961US7005865B2Circuit and method for impedance detectionTOKYO ELECTRON LTD·Filed 2002·Granted Feb 28, 2006·8 cites·15 claims
- 1058US7019540B2Electrostatic capacitance detection circuit and microphone deviceTOKYO ELECTRON LTD·Filed 2002·Granted Mar 28, 2006·8 cites·9 claims
- 1156US7428841B2Acceleration sensor and inclination-detecting methodTOKYO ELECTRON LTD·Filed 2004·Granted Sep 30, 2008·10 cites·7 claims
- 1251US7034551B2Electrostatic capacitance detection circuit and microphone deviceTOKYO ELECTRON LTD·Filed 2002·Granted Apr 25, 2006·2 cites·9 claims
- 1348US2008223136A1Minute structure inspection device, inspection method, and inspection programTOKYO ELECTRON LTD·Filed 2008·Application pending·0 cites
- 1445US7023223B2Impedance measuring circuit and capacitance measuring circuitTOKYO ELECTRON LTD·Filed 2002·Granted Apr 4, 2006·2 cites·6 claims
- 1544US2007262306A1Semiconductor device having microstructure and method of manufacturing microstructureTOKYO ELECTRON LTD·Filed 2007·Application pending·0 cites
- 1644US2008302185A1Microstructure Inspecting Apparatus and Microstructure Inspecting MethodYAKABE MASAMI·Filed 2005·Application pending·0 cites
- 1742US2009140612A1Vibration-Wave DetectorIKEUCHI NAOKI·Filed 2006·Application pending·0 cites
- 1841US2009128171A1Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer ProgramOKUMURA KATSUYA·Filed 2006·Application pending·0 cites
- 1940US2009039908A1Microstructure inspecting apparatus and microstructure inspecting methodTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 2036US2007257692A1ProbeYAKABE MASAMI·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →