Inventor · disambiguated record
Tomohiro Nakamichi
Also filed as: NAKAMICHI TOMOHIRO
5 granted patents·1 pending application·0 citations·filing 2016–2022
58Inventor score
Top patents by PatentIndex Score
6 records- 0163US11764029B2Method of measuring aberration and electron microscopeJEOL LTD·Filed 2022·Granted Sep 19, 2023·0 cites·13 claims
- 0257US12255041B2Electron microscope and method of correcting aberrationJEOL LTD·Filed 2022·Granted Mar 18, 2025·0 cites·11 claims
- 0357US11842880B2Estimation model generation method and electron microscopeJEOL LTD·Filed 2022·Granted Dec 12, 2023·0 cites·8 claims
- 0447US10720302B2Electron microscopeJEOL LTD·Filed 2019·Granted Jul 21, 2020·0 cites·4 claims
- 0546US11222764B2Charged particle beam device and control method of optical system of charged particle beam deviceJEOL LTD·Filed 2020·Granted Jan 11, 2022·0 cites·11 claims
- 0632US2018122535A1Method for manufacturing wire harness and image processing methodAUTONETWORKS TECHNOLOGIES LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →