Inventor · disambiguated record
Takao Yasue
Also filed as: YASUE TAKAO
23 granted patents·601 citations·filing 1987–2001
97Inventor score
Files withMITSUBISHI ELECTRIC CORP23
Top patents by PatentIndex Score
23 records- 0195US6249264B1Surface discharge type plasma display panel with intersecting barrier ribsMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jun 19, 2001·122 cites·18 claims
- 0285US4880975AFine adjustment mechanism for a scanning tunneling microscopeMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Nov 14, 1989·48 cites·14 claims
- 0384US6683589B2Surface discharge type plasma display panel with intersecting barrier ribsMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jan 27, 2004·19 cites·18 claims
- 0482US5107114AFine scanning mechanism for atomic force microscopeMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Apr 21, 1992·45 cites·16 claims
- 0581US4947042ATunnel unit and scanning head for scanning tunneling microscopeMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Aug 7, 1990·39 cites·42 claims
- 0680US5652428AMethod of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphereMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 29, 1997·65 cites·11 claims
- 0775US4945235AFine adjustment mechanism for a scanning tunneling microscopeMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jul 31, 1990·30 cites·14 claims
- 0871US5469733ACantilever for atomic force microscope and method of manufacturing the cantileverMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Nov 28, 1995·31 cites·9 claims
- 0970US5477732AAdhesion measuring methodMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Dec 26, 1995·45 cites·7 claims
- 1066US6638129B2Surface discharge type plasma display panel with intersecting barrier ribsMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 28, 2003·5 cites·12 claims
- 1165US5060043ASemiconductor wafer with notchesMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Oct 22, 1991·29 cites·11 claims
- 1260US4837445ACoarse adjusting device of scanning tunneling microscopeMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jun 6, 1989·19 cites·21 claims
- 1359US5193385ACantilever for use in atomic force microscope and manufacturing method thereforMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Mar 16, 1993·19 cites·14 claims
- 1457US6417620B1Surface discharge plasma display panel having two-dimensional black stripes of specific size and shapeMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jul 9, 2002·12 cites·15 claims
- 1557US5550372AApparatus and method for analyzing foreign matter on semiconductor wafers and for controlling the manufacturing process of semiconductor devicesMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Aug 27, 1996·21 cites·6 claims
- 1650US5723982AApparatus for analyzing thin film propertyMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Mar 3, 1998·15 cites·4 claims
- 1744US5530253ASample stage for scanning probe microscope headMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jun 25, 1996·6 cites·15 claims
- 1837US5043148ATransfer deviceMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Aug 27, 1991·4 cites·11 claims
- 1937US5040048AMetal interconnection layer having reduced hillock formationMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Aug 13, 1991·7 cites·3 claims
- 2036US5088290ATransfer vessel apparatus and method of storing samplesMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Feb 18, 1992·4 cites·9 claims
- 2135US5147824ASemiconductor waferMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Sep 15, 1992·5 cites·3 claims
- 2235US4856297ATransfer vessel device and method of transfer using the deviceMITSUBISHI ELECTRIC CORP·Filed 1987·Granted Aug 15, 1989·5 cites·9 claims
- 2334US5236866AMetal interconnection layer having reduced hillock formation in semi-conductor device and manufacturing method thereforMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Aug 17, 1993·6 cites·8 claims
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