Inventor · disambiguated record
Teymur Bakhishev
Also filed as: BAKHISHEV TEYMUR
26 granted patents·3 pending applications·124 citations·filing 2012–2023
95Inventor score
Top patents by PatentIndex Score
29 records- 0196US10156852B2Systems and methods for using radio frequency signals and sensors to monitor environmentsLOCIX INC·Filed 2016·Granted Dec 18, 2018·15 cites·20 claims
- 0295US9299801B1Method for fabricating a transistor device with a tuned dopant profileMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Mar 29, 2016·21 cites·14 claims
- 0392US9478571B1Buried channel deeply depleted channel transistorMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Oct 25, 2016·10 cites·9 claims
- 0490US11030902B2Systems and methods for using radio frequency signals and sensors to monitor environmentsLOCIX INC·Filed 2019·Granted Jun 8, 2021·8 cites·22 claims
- 0590US10514704B2Systems and methods for using radio frequency signals and sensors to monitor environmentsLOCIX INC·Filed 2017·Granted Dec 24, 2019·5 cites·20 claims
- 0690US9763054B2Systems and methods for determining locations of wireless sensor nodes in a tree network architecture having mesh-based featuresDRAGONFLY TECH INC·Filed 2015·Granted Sep 12, 2017·7 cites·20 claims
- 0789US9299698B2Semiconductor structure with multiple transistors having various threshold voltagesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Mar 29, 2016·7 cites·9 claims
- 0889US9196727B2High uniformity screen and epitaxial layers for CMOS devicesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Nov 24, 2015·8 cites·7 claims
- 0988US9846220B2Systems and methods for determining locations of wireless sensor nodes in a network architecture having mesh-based features for localizationDRAGONFLY TECH INC·Filed 2015·Granted Dec 19, 2017·7 cites·24 claims
- 1084US10104508B2Systems and methods for determining locations of wireless sensor nodes in a tree network architecture having mesh-based featuresLOCIX INC·Filed 2017·Granted Oct 16, 2018·3 cites·20 claims
- 1183US10504364B2Systems and methods for using radio frequency signals and sensors to monitor environmentsLOCIX INC·Filed 2018·Granted Dec 10, 2019·3 cites·19 claims
- 1283US9368624B2Method for fabricating a transistor with reduced junction leakage currentMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Jun 14, 2016·3 cites·1 claims
- 1383US8883600B1Transistor having reduced junction leakage and methods of forming thereofTHOMPSON SCOTT E·Filed 2012·Granted Nov 11, 2014·5 cites·13 claims
- 1481US9577041B2Method for fabricating a transistor device with a tuned dopant profileMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Feb 21, 2017·2 cites·4 claims
- 1581US9041126B2Deeply depleted MOS transistors having a screening layer and methods thereofSUVOLTA INC·Filed 2013·Granted May 26, 2015·6 cites·19 claims
- 1680US9786703B2Buried channel deeply depleted channel transistorMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Oct 10, 2017·2 cites·7 claims
- 1779US2024171293A1Systems and methods for using radio frequency signals and sensors to monitor environmentsZAINAR INC·Filed 2023·Application pending·0 cites
- 1876US8778786B1Method for substrate preservation during transistor fabricationSCUDDER LANCE·Filed 2012·Granted Jul 15, 2014·4 cites·19 claims
- 1976US8637955B1Semiconductor structure with reduced junction leakage and method of fabrication thereofWANG LINGQUAN·Filed 2012·Granted Jan 28, 2014·5 cites·20 claims
- 2074US2022172622A1Systems and methods for using radio frequency signals and sensors to monitor environmentsLOCIX INC·Filed 2022·Application pending·0 cites
- 2173US11276308B2Systems and methods for using radio frequency signals and sensors to monitor environmentsLOCIX INC·Filed 2019·Granted Mar 15, 2022·1 cites·22 claims
- 2272US10568064B2Systems and methods for precise radio frequency localization using time difference of arrivalLOCIX INC·Filed 2017·Granted Feb 18, 2020·2 cites·22 claims
- 2362US10217838B2Semiconductor structure with multiple transistors having various threshold voltagesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Feb 26, 2019·0 cites·9 claims
- 2459US9812550B2Semiconductor structure with multiple transistors having various threshold voltagesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Nov 7, 2017·0 cites·1 claims
- 2557US10014387B2Semiconductor structure with multiple transistors having various threshold voltagesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Jul 3, 2018·0 cites·10 claims
- 2657US9991300B2Buried channel deeply depleted channel transistorMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Jun 5, 2018·0 cites·2 claims
- 2757US9893148B2Method for fabricating a transistor device with a tuned dopant profileMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Feb 13, 2018·0 cites·3 claims
- 2854US9105711B2Semiconductor structure with reduced junction leakage and method of fabrication thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 11, 2015·0 cites·18 claims
- 2940US2019385364A1Method and system for associating relevant information with a point of interest on a virtual representation of a physical object created using digital input dataJOSEPH JOHN·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →