Inventor · disambiguated record
Hee Jin Byun
Also filed as: BYUN HEE-JIN
24 granted patents·2 pending applications·1,079 citations·filing 2005–2019
94Inventor score
Top patents by PatentIndex Score
26 records- 0197US8400851B2Output enable signal generation circuit of semiconductor memoryBYUN HEE JIN·Filed 2010·Granted Mar 19, 2013·1k cites·9 claims
- 0293US7158430B2Bit line sense amplifier control circuitHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Jan 2, 2007·31 cites·12 claims
- 0377US7298660B2Bit line sense amplifier control circuitHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 20, 2007·9 cites·12 claims
- 0472US8406080B2Data output control circuit of a double data rate (DDR) synchronous semiconductor memory device responsive to a delay locked loop (DLL) clock and method thereofBYUN HEE-JIN·Filed 2010·Granted Mar 26, 2013·4 cites·14 claims
- 0568US9324394B2Strobe signal generation device and memory apparatus using the sameSK HYNIX INC·Filed 2014·Granted Apr 26, 2016·3 cites·18 claims
- 0668US8509005B2Data strobe signal generating device and a semiconductor memory apparatus using the sameBYUN HEE-JIN·Filed 2011·Granted Aug 13, 2013·3 cites·11 claims
- 0766US9875777B2Semiconductor memory device and method for operating the sameSK HYNIX INC·Filed 2014·Granted Jan 23, 2018·3 cites·19 claims
- 0864US9349424B2Semiconductor apparatus configured to manage an operation timing marginSK HYNIX INC·Filed 2014·Granted May 24, 2016·2 cites·20 claims
- 0960US8031553B2Data strobe signal generating device and a semiconductor memory apparatus using the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Oct 4, 2011·3 cites·11 claims
- 1057US7852707B2Data output control circuit of a double data rate (DDR) synchronous semiconductor memory device responsive to a delay locked loop (DLL) clockHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Dec 14, 2010·3 cites·5 claims
- 1156US11429477B2Semiconductor devicesSK HYNIX INC·Filed 2019·Granted Aug 30, 2022·0 cites·27 claims
- 1254US9123403B2Semiconductor memory apparatus including a plurality of banks and semiconductor integrated circuit including the sameBYUN HEE JIN·Filed 2012·Granted Sep 1, 2015·1 cites·19 claims
- 1353US7283415B2Apparatus for controlling activation period of word line of volatile memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Oct 16, 2007·2 cites·8 claims
- 1444US10706933B2Semiconductor deviceSK HYNIX INC·Filed 2018·Granted Jul 7, 2020·0 cites·20 claims
- 1544US9704547B2Semiconductor apparatus configured to control data output timingSK HYNIX INC·Filed 2016·Granted Jul 11, 2017·0 cites·20 claims
- 1642US8947955B2Semiconductor memory, memory system, and operation method thereofSK HYNIX INC·Filed 2013·Granted Feb 3, 2015·0 cites·18 claims
- 1741US9530474B2Semiconductor integrated circuit including semiconductor memory apparatus including a plurality of banksSK HYNIX INC·Filed 2015·Granted Dec 27, 2016·0 cites·12 claims
- 1841US7660179B2Apparatus for controlling activation period of word line of volatile memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Feb 9, 2010·0 cites·16 claims
- 1940US10763181B2Semiconductor device and repair operation method thereofSK HYNIX INC·Filed 2018·Granted Sep 1, 2020·0 cites·20 claims
- 2040US7738315B2Circuit for generating output enable signal in semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jun 15, 2010·0 cites·12 claims
- 2140US2020335154A1Memory deviceSK HYNIX INC·Filed 2019·Application pending·0 cites
- 2239US9472266B2Semiconductor deviceSK HYNIX INC·Filed 2014·Granted Oct 18, 2016·0 cites·18 claims
- 2339US8164963B2Semiconductor memory deviceBYUN HEE-JIN·Filed 2009·Granted Apr 24, 2012·0 cites·8 claims
- 2439US7843744B2Semiconductor memory device and operation method thereofHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Nov 30, 2010·0 cites·33 claims
- 2533US8547764B2Semiconductor memory device and method for performing data compression test of the sameYUN JAE-WOONG·Filed 2009·Granted Oct 1, 2013·0 cites·7 claims
- 2633US2011292740A1Semiconductor device and method for operating the sameBYUN HEE-JIN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →