Inventor · disambiguated record
Toshitaka Fukushima
Also filed as: FUKUSHIMA TOSHITAKA
35 granted patents·2 pending applications·613 citations·filing 1979–2021
97Inventor score
Top patents by PatentIndex Score
37 records- 0197US4922319ASemiconductor programmable memory deviceFUJITSU LTD·Filed 1989·Granted May 1, 1990·143 cites·19 claims
- 0289US4907062ASemiconductor wafer-scale integrated device composed of interconnected multiple chips each having an integration circuit chip formed thereonFUJITSU LTD·Filed 1988·Granted Mar 6, 1990·83 cites·14 claims
- 0386US4287569ASemiconductor memory deviceFUJITSU LTD·Filed 1979·Granted Sep 1, 1981·28 cites·10 claims
- 0483US9036455B2Electronic timepieceSEIKO INSTR INC·Filed 2013·Granted May 19, 2015·5 cites·12 claims
- 0580US12068491B2Monitoring system, battery-type power supply device, monitoring server apparatus and monitoring programNOVARS INC·Filed 2021·Granted Aug 20, 2024·1 cites·13 claims
- 0677US4320507AField programmable device having test provisions for fault detectionFUJITSU LTD·Filed 1979·Granted Mar 16, 1982·18 cites·7 claims
- 0775US4839854AData collection system having stationary unit with electromagnetic induction circuitry for bidirectionally relaying dataSEIKO INSTR & ELECTRONICS·Filed 1986·Granted Jun 13, 1989·51 cites·3 claims
- 0874US4866004AMethod of forming groove isolation filled with dielectric for semiconductor deviceFUJITSU LTD·Filed 1988·Granted Sep 12, 1989·43 cites·6 claims
- 0974US4459694AField programmable device with circuitry for detecting poor insulation between adjacent word linesFUJITSU LTD·Filed 1981·Granted Jul 10, 1984·23 cites·4 claims
- 1072US4322640AThree-state output circuitFUJITSU LTD·Filed 1979·Granted Mar 30, 1982·13 cites·8 claims
- 1170US4429388AField programmable device with internal dynamic test circuitFUJITSU LTD·Filed 1980·Granted Jan 31, 1984·18 cites·40 claims
- 1267US9092015B2Electronic timepieceSEIKO INSTR INC·Filed 2013·Granted Jul 28, 2015·1 cites·16 claims
- 1364US4319300ASurge arrester assemblyTII IND INC·Filed 1979·Granted Mar 9, 1982·14 cites·11 claims
- 1463US4319341AProgramming circuit for permanently storing data in a programmable read only memoryFUJITSU LTD·Filed 1980·Granted Mar 9, 1982·15 cites·6 claims
- 1560US4498022ATristate output buffer with high-impedance state responsive to increase in power supply voltageFUJITSU LTD·Filed 1981·Granted Feb 5, 1985·13 cites·19 claims
- 1658US4320411AIntegrated circuit with double dielectric isolation wallsFUJITSU LTD·Filed 1979·Granted Mar 16, 1982·17 cites·18 claims
- 1756US4654688ASemiconductor device having a transistor with increased current amplification factorFUJITSU LTD·Filed 1984·Granted Mar 31, 1987·15 cites·10 claims
- 1852US4347584AProgrammable read-only memory deviceFUJITSU LTD·Filed 1980·Granted Aug 31, 1982·9 cites·9 claims
- 1951US4617653ASemiconductor memory device utilizing multi-stage decodingFUJITSU LTD·Filed 1983·Granted Oct 14, 1986·8 cites·16 claims
- 2049US4808550AMethod of producing isolation groove structureFUJITSU LTD·Filed 1988·Granted Feb 28, 1989·16 cites·4 claims
- 2146US4862459ATest method for detecting faulty memory cell of a programmable deviceFUJITSU LTD·Filed 1986·Granted Aug 29, 1989·9 cites·17 claims
- 2245US8982675B2Power supply unit and electronic timepieceKATO KAZUO·Filed 2011·Granted Mar 17, 2015·0 cites·19 claims
- 2344US4424582ASemiconductor memory deviceFUJITSU LTD·Filed 1980·Granted Jan 3, 1984·6 cites·18 claims
- 2443US5187720ASynchronous serial communication circuitSEIKO INSTR INC·Filed 1990·Granted Feb 16, 1993·15 cites·3 claims
- 2543US4376984AProgrammable read-only memory deviceFUJITSU LTD·Filed 1980·Granted Mar 15, 1983·10 cites·30 claims
- 2642US10763555B2Battery-type power supply device and battery-driven load deviceNOVARS INC·Filed 2019·Granted Sep 1, 2020·0 cites·8 claims
- 2739US2013194897A1Electronic timepieceSEIKO INSTR INC·Filed 2013·Application pending·0 cites
- 2838US4943742ASchottky barrier diode clamp transistorFUJITSU LTD·Filed 1989·Granted Jul 24, 1990·4 cites·5 claims
- 2938US4482914AContact structure of semiconductor deviceFUJITSU LTD·Filed 1981·Granted Nov 13, 1984·8 cites·9 claims
- 3035US4635645AElectronic sphygmomanometerSEIKO INSTR & ELECTRONICS·Filed 1984·Granted Jan 13, 1987·9 cites·14 claims
- 3135US2013003508A1Electronic apparatusKATO KAZUO·Filed 2012·Application pending·0 cites
- 3234US4607641AElectronic sphygmomanometerSEIKO INSTR & ELECTRONICS·Filed 1984·Granted Aug 26, 1986·9 cites·5 claims
- 3332US4792833AJunction-shorting type semiconductor read-only memory having increased speed and increased integration densityFUJITSU LTD·Filed 1986·Granted Dec 20, 1988·4 cites·24 claims
- 3431US4468856AMethod for forming an ohmic contact to a semiconductor substrateFUJITSU LTD·Filed 1982·Granted Sep 4, 1984·2 cites·10 claims
- 3531US4466012ASemiconductor device with deep oxide isolationFUJITSU LTD·Filed 1982·Granted Aug 14, 1984·2 cites·12 claims
- 3630US4805141ABipolar PROM having transistors with reduced base widthsFUJITSU LTD·Filed 1986·Granted Feb 14, 1989·0 cites·6 claims
- 3729US5187441APortable information apparatus for sensing battery voltage dropSEIKO INSTR INC·Filed 1990·Granted Feb 16, 1993·1 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →