Inventor · disambiguated record
Yi-Tsang Hsieh
Also filed as: HSIEH YI MEI · HSIEH YI-TSANG
8 granted patents·6 pending applications·9 citations·filing 2002–2025
77Inventor score
Top patents by PatentIndex Score
14 records- 0191US12165851B2Plasma processing method for manufacturing semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 10, 2024·2 cites·20 claims
- 0291US10510598B2Self-aligned spacers and method forming sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 17, 2019·7 cites·20 claims
- 0382US2025357090A1Plasma processing apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0478US12444580B2Plasma processing apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 14, 2025·0 cites·20 claims
- 0573US2025069860A1Plasma processing method for manufacturing semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0670US2024387152A1Dry etcher uniformity control by tuning edge zone plasma sheathTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0770US2024379387A1Small gas flow monitoring of dry etcher by oes signalTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0868US11532515B2Self-aligned spacers and method forming sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 20, 2022·0 cites·20 claims
- 0963US12334314B2Dry etcher uniformity control by tuning edge zone plasma sheathTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 17, 2025·0 cites·20 claims
- 1060US12142494B2Small gas flow monitoring of dry etcher by OES signalTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Nov 12, 2024·0 cites·20 claims
- 1158US10804149B2Self-aligned spacers and method forming sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Oct 13, 2020·0 cites·20 claims
- 1235US2004041700A1Speed indicating meansFiled 2002·Application pending·0 cites
- 1334US2020070573A1Bicycle hub shaft structureHSIEH YI TSANG·Filed 2018·Application pending·0 cites
- 1428US8607100B2Motherboard testing device and testing method thereofHSIEH YI-TSANG·Filed 2011·Granted Dec 10, 2013·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →