Inventor · disambiguated record
Ming-Hui Chih
Also filed as: CHIH MING-HUI
31 granted patents·315 citations·filing 2010–2023
96Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD16TAIWAN SEMICONDUCTOR MFG9CHIH MING-HUI2WANG HUNG-CHUN2CHEN PI-TSUNG1
Top patents by PatentIndex Score
31 records- 0198US9679100B2Environmental-surrounding-aware OPCTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jun 13, 2017·20 cites·20 claims
- 0298US9390217B2Methodology of optical proximity correction optimizationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 12, 2016·68 cites·20 claims
- 0397US8631360B2Methodology of optical proximity correction optimizationWANG HUNG-CHUN·Filed 2012·Granted Jan 14, 2014·34 cites·19 claims
- 0496US8627241B2Pattern correction with location effectWANG HUNG-CHUN·Filed 2012·Granted Jan 7, 2014·45 cites·18 claims
- 0595US9176373B2System and method for decomposition of a single photoresist mask pattern into 3 photoresist mask patternsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 3, 2015·11 cites·20 claims
- 0695US8943445B2Method of merging color sets of layoutTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 27, 2015·29 cites·20 claims
- 0792US8527916B1Dissection splitting with optical proximity correction to reduce corner roundingCHIANG CHIA-PING·Filed 2012·Granted Sep 3, 2013·38 cites·18 claims
- 0891US8381153B2Dissection splitting with optical proximity correction and mask rule check enforcementTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Feb 19, 2013·21 cites·20 claims
- 0990US8631379B2Decomposing integrated circuit layoutCHEN PI-TSUNG·Filed 2010·Granted Jan 14, 2014·21 cites·14 claims
- 1087US12159092B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 3, 2024·0 cites·20 claims
- 1186US11048161B2Optical proximity correction methodology using pattern classification for target placementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 29, 2021·2 cites·20 claims
- 1286US10324369B2Methods for generating a mandrel maskTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jun 18, 2019·4 cites·19 claims
- 1384US9165095B2Target point generation for optical proximity correctionTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 20, 2015·4 cites·20 claims
- 1483US9390223B2Method of determining whether a layout is colorableTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Jul 12, 2016·2 cites·20 claims
- 1582US9911606B2Mandrel spacer patterning in multi-pitch integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 6, 2018·3 cites·20 claims
- 1682US9189588B2Polygon-based optical proximity correctionTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 17, 2015·3 cites·20 claims
- 1782US8972909B1OPC method with higher degree of freedomTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Mar 3, 2015·4 cites·20 claims
- 1876US11790145B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 1976US9411924B2Methodology for pattern density optimizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 9, 2016·3 cites·20 claims
- 2075US11392742B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 19, 2022·0 cites·20 claims
- 2175US10049178B2Methodology for pattern density optimizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Aug 14, 2018·1 cites·20 claims
- 2271US10796055B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 6, 2020·0 cites·20 claims
- 2370US9026955B1Methodology for pattern correctionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 5, 2015·2 cites·17 claims
- 2464US10860774B2Methodology for pattern density optimizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 8, 2020·0 cites·20 claims
- 2564US10509881B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 17, 2019·0 cites·20 claims
- 2659US10527928B2Optical proximity correction methodology using pattern classification for target placementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 7, 2020·0 cites·20 claims
- 2757US10036948B2Environmental-surrounding-aware OPCTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 31, 2018·0 cites·20 claims
- 2848US8499261B2Method and apparatus of patterning semiconductor deviceCHIH MING-HUI·Filed 2012·Granted Jul 30, 2013·0 cites·4 claims
- 2946US9003336B2Mask assignment optimizationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Apr 7, 2015·0 cites·18 claims
- 3046US8959460B1Layout decomposition methodTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Feb 17, 2015·0 cites·20 claims
- 3144US8196072B2Method and apparatus of patterning semiconductor deviceCHIH MING-HUI·Filed 2010·Granted Jun 5, 2012·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →