Inventor · disambiguated record
Timothy R. Tiemeyer
Also filed as: TIEMEYER TIMOTHY · TIEMEYER TIMOTHY R
6 granted patents·3 pending applications·107 citations·filing 2004–2013
85Inventor score
Top patents by PatentIndex Score
9 records- 0193US7505125B2System and method for signal processing for a workpiece surface inspection systemKLA TENCOR CORP·Filed 2005·Granted Mar 17, 2009·26 cites·30 claims
- 0292US7286218B2System and method for inspecting a workpiece surface using surface structure spatial frequenciesKLA TENCOR TECH CORP·Filed 2005·Granted Oct 23, 2007·49 cites·14 claims
- 0385US9103800B2System with multiple scattered light collectorsKLA TENCOR CORP·Filed 2013·Granted Aug 11, 2015·2 cites·12 claims
- 0479US7280200B2Detection of a wafer edge using collimated lightADE CORP·Filed 2004·Granted Oct 9, 2007·25 cites·37 claims
- 0571US8497984B2System and method for inspection of a workpiece surface using multiple scattered light collectorsBILLS RICHARD EARL·Filed 2005·Granted Jul 30, 2013·1 cites·1 claims
- 0667US8260035B2Threshold determination in an inspection systemTEK MEHMET·Filed 2006·Granted Sep 4, 2012·4 cites·10 claims
- 0743US2009073440A1System and method for detecting surface features on a semiconductor workpiece surfaceTIEMEYER TIMOTHY·Filed 2006·Application pending·0 cites
- 0838US2004258295A1Method and system for classifying defects occurring at a surface of a substrate using graphical representation of multi-channel dataADE CORP·Filed 2004·Application pending·0 cites
- 0936US2004252879A1Method and system for analyzing and tracking defects among a plurality of substrates such as silicon wafersADE CORP·Filed 2004·Application pending·0 cites
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