Inventor · disambiguated record
Chih-Wen Feng
Also filed as: FENG CHIH-WEN
9 granted patents·4 pending applications·16 citations·filing 2007–2013
82Inventor score
Top patents by PatentIndex Score
13 records- 0178US8592321B2Method for fabricating an apertureCHANG FENG-YI·Filed 2011·Granted Nov 26, 2013·4 cites·14 claims
- 0275US8236702B2Method of fabricating openings and contact holesCHANG FENG-YI·Filed 2008·Granted Aug 7, 2012·6 cites·10 claims
- 0366US8461649B2Opening structure for semiconductor deviceTSAO PO-CHAO·Filed 2011·Granted Jun 11, 2013·2 cites·9 claims
- 0460US8164141B2Opening structure with sidewall of an opening covered with a dielectric thin filmTSAO PO-CHAO·Filed 2010·Granted Apr 24, 2012·1 cites·12 claims
- 0557US8252650B1Method for fabricating CMOS transistorCHANG FENG-YI·Filed 2011·Granted Aug 28, 2012·1 cites·15 claims
- 0655US8835324B2Method for forming contact holesCHEN CHIEH-TE·Filed 2011·Granted Sep 16, 2014·1 cites·13 claims
- 0753US8101092B2Method for controlling ADI-AEI CD difference ratio of openings having different sizesFENG CHIH-WEN·Filed 2007·Granted Jan 24, 2012·1 cites·16 claims
- 0850US8592322B2Method of fabricating openingsCHANG FENG-YI·Filed 2012·Granted Nov 26, 2013·0 cites·13 claims
- 0950US2014038399A1Method for fabricating an apertureUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 1040US2010317195A1Method for fabricating an apertureFENG CHIH-WEN·Filed 2009·Application pending·0 cites
- 1137US8293639B2Method for controlling ADI-AEI CD difference ratio of openings having different sizesCHANG FENG-YIH·Filed 2009·Granted Oct 23, 2012·0 cites·20 claims
- 1236US2011223768A1Method for Forming Contact OpeningUNITED MICROELECTRONICS CORP·Filed 2010·Application pending·0 cites
- 1335US2011174774A1Method of descumming patterned photoresistLIN YING-CHIH·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →