Inventor · disambiguated record
Hung-En Tai
Also filed as: TAI HUNG-EN
11 granted patents·2 pending applications·92 citations·filing 2003–2006
89Inventor score
Top patents by PatentIndex Score
13 records- 0174US7099729B2Semiconductor process and yield analysis integrated real-time management methodPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Aug 29, 2006·18 cites·19 claims
- 0274US7079677B2Automatic intelligent yield improving and process parameter multivariate system and the analysis method thereofPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Jul 18, 2006·19 cites·14 claims
- 0372US6959252B2Method for analyzing in-line QC test parametersPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Oct 25, 2005·12 cites·18 claims
- 0471US7218981B1Dispatch integration system and method based on semiconductor manufacturingPOWERCHIP SEMICONDUCTOR CORP·Filed 2006·Granted May 15, 2007·7 cites·8 claims
- 0562US6904384B2Complex multivariate analysis system and methodPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Jun 7, 2005·10 cites·16 claims
- 0659US6828776B2Method for analyzing defect inspection parametersPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Dec 7, 2004·10 cites·10 claims
- 0758US6968280B2Method for analyzing wafer test parametersPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted Nov 22, 2005·7 cites·32 claims
- 0857US2004186736A1Method of managing semiconductor manufacturing casesFiled 2003·Application pending·0 cites
- 0955US6898539B2Method for analyzing final test parametersPOWERCHIP SEMICONDUCTOR CORP·Filed 2003·Granted May 24, 2005·5 cites·16 claims
- 1051US6999897B2Method and related system for semiconductor equipment early warning managementPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Feb 14, 2006·4 cites·14 claims
- 1146US7412090B2Method of managing wafer defectsPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Aug 12, 2008·0 cites·6 claims
- 1239US6950783B1Method and related system for semiconductor equipment prevention maintenance managementPOWERCHIP SEMICONDUCTOR CORP·Filed 2004·Granted Sep 27, 2005·0 cites·18 claims
- 1337US2006048010A1Data analyzing method for a fault detection and classification systemTAI HUNG-EN·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →