Inventor · disambiguated record
Paul Sandland
Also filed as: SANDLAND PAUL
7 granted patents·1,097 citations·filing 1977–1984
90Inventor score
Top patents by PatentIndex Score
7 records- 0198US4247203AAutomatic photomask inspection system and apparatusKLA INSTR CORP·Filed 1978·Granted Jan 27, 1981·281 cites·29 claims
- 0297US4347001AAutomatic photomask inspection system and apparatusKLA INSTR CORP·Filed 1979·Granted Aug 31, 1982·157 cites·3 claims
- 0395US4644172AElectronic control of an automatic wafer inspection systemKLA INSTR CORP·Filed 1984·Granted Feb 17, 1987·278 cites·8 claims
- 0495US4618938AMethod and apparatus for automatic wafer inspectionKLA INSTR CORP·Filed 1984·Granted Oct 21, 1986·247 cites·25 claims
- 0593US4556317AX-Y Stage for a patterned wafer automatic inspection systemKLA INSTR CORP·Filed 1984·Granted Dec 3, 1985·112 cites·18 claims
- 0653US4334154ATomographic scanning apparatusGEN ELECTRIC·Filed 1978·Granted Jun 8, 1982·14 cites·1 claims
- 0744US4236079ATomographic scanning apparatusGEN ELECTRIC·Filed 1977·Granted Nov 25, 1980·8 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →