Inventor · disambiguated record
John A. Griesemer
Also filed as: GRIESEMER JOHN A
11 granted patents·38 citations·filing 2010–2017
88Inventor score
Top patents by PatentIndex Score
11 records- 0190US9059167B2Structure and method for making crack stop for 3D integrated circuitsIBM·Filed 2014·Granted Jun 16, 2015·8 cites·17 claims
- 0289US8859390B2Structure and method for making crack stop for 3D integrated circuitsFAROOQ MUKTA G·Filed 2010·Granted Oct 14, 2014·9 cites·10 claims
- 0386US9891261B2Electromigration monitorIBM·Filed 2014·Granted Feb 13, 2018·6 cites·10 claims
- 0475US9040418B2Enhanced capture pads for through semiconductor viasIBM·Filed 2013·Granted May 26, 2015·3 cites·19 claims
- 0573US8237288B1Enhanced electromigration resistance in TSV structure and designFAROOQ MUKTA G·Filed 2011·Granted Aug 7, 2012·3 cites·7 claims
- 0672US9404953B2Structures and methods for monitoring dielectric reliability with through-silicon viasIBM·Filed 2013·Granted Aug 2, 2016·2 cites·12 claims
- 0772US8386977B2Circuit design checking for three dimensional chip technologyIBM·Filed 2011·Granted Feb 26, 2013·3 cites·13 claims
- 0869US8772949B2Enhanced capture pads for through semiconductor viasIBM·Filed 2012·Granted Jul 8, 2014·2 cites·15 claims
- 0969US8288270B2Enhanced electromigration resistance in TSV structure and designFAROOQ MUKTA G·Filed 2012·Granted Oct 16, 2012·2 cites·7 claims
- 1058US10677833B2Electromigration monitorIBM·Filed 2017·Granted Jun 9, 2020·0 cites·12 claims
- 1156US10794948B2Electromigration monitorIBM·Filed 2017·Granted Oct 6, 2020·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →