Inventor · disambiguated record
Patrick R. Khayat
Also filed as: KHAYAT PATRICK · KHAYAT PATRICK R · KHAYAT PATRICK ROBERT
130 granted patents·27 pending applications·374 citations·filing 2009–2025
99Inventor score
Top patents by PatentIndex Score
157 records- 0198US11562793B2Read soft bits through boosted modulation following reading hard bitsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 24, 2023·8 cites·18 claims
- 0298US11474748B2Compound feature generation in classification of error rate of data retrieved from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 18, 2022·12 cites·20 claims
- 0398US11403042B2Self adapting iterative read calibration to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 2, 2022·9 cites·20 claims
- 0498US11257546B2Reading of soft bits and hard bits from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 22, 2022·11 cites·20 claims
- 0598US11221800B2Adaptive and/or iterative operations in executing a read command to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 11, 2022·11 cites·17 claims
- 0698US11200959B1Optimization of soft bit windows based on signal and noise characteristics of memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 14, 2021·7 cites·20 claims
- 0798US11086572B1Self adapting iterative read calibration to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 10, 2021·20 cites·16 claims
- 0898US11081200B1Intelligent proactive responses to operations to read data from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 3, 2021·18 cites·20 claims
- 0998US11049582B1Detection of an incorrectly located read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 29, 2021·16 cites·20 claims
- 1098US11029890B1Compound feature generation in classification of error rate of data retrieved from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 8, 2021·25 cites·20 claims
- 1198US11024401B1Compute an optimized read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 1, 2021·15 cites·20 claims
- 1297US11355203B2Determine optimized read voltage via identification of distribution shape of signal and noise characteristicsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 7, 2022·6 cites·16 claims
- 1397US11238953B2Determine bit error count based on signal and noise characteristics centered at an optimized read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 1, 2022·6 cites·20 claims
- 1496US11726719B2Compound feature generation in classification of error rate of data retrieved from memory cellsMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 15, 2023·3 cites·20 claims
- 1596US11709734B2Error correction with syndrome computation in a memory deviceMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·5 cites·20 claims
- 1696US11657886B2Intelligent proactive responses to operations to read data from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted May 23, 2023·4 cites·20 claims
- 1796US11227666B1Track charge loss based on signal and noise characteristics of memory cells collected in calibration operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 18, 2022·4 cites·20 claims
- 1896US11205495B1Read disturb mitigation based on signal and noise characteristics of memory cells collected for read calibrationMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 21, 2021·4 cites·20 claims
- 1995US11775217B2Adaptive and/or iterative operations in executing a read command to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 3, 2023·3 cites·20 claims
- 2095US11762599B2Self adapting iterative read calibration to retrieve data from memory cellsMICRON TECHNOLOGY INC·Filed 2022·Granted Sep 19, 2023·3 cites·20 claims
- 2195US11670396B2Determine bit error count based on signal and noise characteristics centered at an optimized read voltageMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 6, 2023·3 cites·20 claims
- 2295US11662905B2Memory system performance enhancements using measured signal and noise characteristics of memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted May 30, 2023·3 cites·20 claims
- 2395US11177013B1Determine signal and noise characteristics centered at an optimized read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 16, 2021·4 cites·20 claims
- 2495US11133083B1Read model of memory cells using information generated during read operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 28, 2021·4 cites·20 claims
- 2594US12046298B2Managing compensation for charge coupling and lateral migration in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 23, 2024·2 cites·20 claims
- 2694US11934266B2Memory compaction management in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Mar 19, 2024·2 cites·19 claims
- 2794US11276473B2Coarse calibration based on signal and noise characteristics of memory cells collected in prior calibration operationsMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 15, 2022·3 cites·20 claims
- 2894US11237726B2Memory system performance enhancements using measured signal and noise characteristics of memory cellsMICRON TECHNOLOGY INC·Filed 2019·Granted Feb 1, 2022·12 cites·20 claims
- 2993US11152073B1Iterative read calibration enhanced according to patterns of shifts in read voltagesMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 19, 2021·3 cites·20 claims
- 3092US11587638B2Read model of memory cells using information generated during read operationsMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 21, 2023·2 cites·20 claims
- 3191US11740970B2Dynamic adjustment of data integrity operations of a memory system based on error rate classificationMICRON TECHNOLOGY INC·Filed 2020·Granted Aug 29, 2023·3 cites·25 claims
- 3291US8745466B2Detecting data-write errorsKAYNAK MUSTAFA N·Filed 2010·Granted Jun 3, 2014·22 cites·38 claims
- 3390US12009040B2Detection of an incorrectly located read voltageMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 11, 2024·1 cites·20 claims
- 3490US11275515B1Descrambling of scrambled linear codewords using non-linear scramblersMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 15, 2022·2 cites·20 claims
- 3590US10540228B2Providing data of a memory system based on an adjustable error rateMICRON TECHNOLOGY INC·Filed 2018·Granted Jan 21, 2020·5 cites·20 claims
- 3690US10331514B2Tiered error correction code (ECC) operations in memoryMICRON TECHNOLOGY INC·Filed 2017·Granted Jun 25, 2019·7 cites·31 claims
- 3790US8996967B2Rendering data write errors detectableKAYNAK MUSTAFA N·Filed 2010·Granted Mar 31, 2015·19 cites·40 claims
- 3888US11886718B2Descrambling of scrambled linear codewords using non-linear scramblersMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 30, 2024·1 cites·20 claims
- 3988US11244729B1Search for an optimized read voltageMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 8, 2022·2 cites·20 claims
- 4088US10312944B2Error correction code (ECC) operations in memory for providing redundant error correctionMICRON TECHNOLOGY INC·Filed 2017·Granted Jun 4, 2019·6 cites·30 claims
- 4188US9064575B2Determining whether a memory cell state is in a valley between adjacent data statesPARTHASARATHY SIVAGNANAM·Filed 2012·Granted Jun 23, 2015·8 cites·16 claims
- 4287US12073899B2Track charge loss based on signal and noise characteristics of memory cells collected in calibration operationsMICRON TECHNOLOGY INC·Filed 2021·Granted Aug 27, 2024·1 cites·20 claims
- 4387US12046296B2Reading of soft bits and hard bits from memory cellsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 23, 2024·1 cites·15 claims
- 4487US10860416B2Tiered error correction code (ECC) operations in memoryMICRON TECHNOLOGY INC·Filed 2019·Granted Dec 8, 2020·3 cites·20 claims
- 4587US10732890B2Adjusting a parameter for a programming operation based on the temperature of a memory systemMICRON TECHNOLOGY INC·Filed 2018·Granted Aug 4, 2020·5 cites·18 claims
- 4687US2025364057A1Managing compensation for charge coupling and lateral migration in memory devicesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4786US12046307B2Managing program verify voltage offsets for charge coupling and lateral migration compensation in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 23, 2024·1 cites·20 claims
- 4885US12009034B2Classification of error rate of data retrieved from memory cellsMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 11, 2024·2 cites·20 claims
- 4985US9577673B2Error correction methods and apparatuses using first and second decodersMICRON TECHNOLOGY INC·Filed 2012·Granted Feb 21, 2017·8 cites·28 claims
- 5084US10135465B2Error correction methods and apparatuses using first and second decodersMICRON TECHNOLOGY INC·Filed 2017·Granted Nov 20, 2018·5 cites·17 claims
Showing the top 50 of 157 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →