Inventor · disambiguated record
Shoaib Zaidi
Also filed as: ZAIDI SHOAIB · ZAIDI SHOAIB H · ZAIDI SHOAIB HASAN
16 granted patents·7 pending applications·95 citations·filing 2001–2010
92Inventor score
Files withINFINEON TECHNOLOGIES AG9ZAIDI SHOAIB5QIMONDA AG3QIMONDA NORTH AMERICA CORP3INFINEON TECHNOLOGIES CORP1
Top patents by PatentIndex Score
23 records- 0188US7427774B1Targets for measurements in semiconductor devicesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 23, 2008·17 cites·19 claims
- 0283US7718464B2Integrated circuit fabricated using an oxidized polysilicon maskQIMONDA NORTH AMERICA CORP·Filed 2008·Granted May 18, 2010·9 cites·12 claims
- 0378US6888260B2Alignment or overlay marks for semiconductor processingINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 3, 2005·28 cites·37 claims
- 0473US7408240B2Memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Aug 5, 2008·5 cites·20 claims
- 0569US7361925B2Integrated circuit having a memory including a low-k dielectric material for thermal isolationINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 22, 2008·6 cites·26 claims
- 0663US7016027B2System and method for quantifying errors in an alternating phase shift maskINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 21, 2006·4 cites·14 claims
- 0758US6687014B2Method for monitoring the rate of etching of a semiconductorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 3, 2004·8 cites·32 claims
- 0856US7973301B2Low power phase change memory cell with large read signalQIMONDA AG·Filed 2005·Granted Jul 5, 2011·3 cites·23 claims
- 0956US6548314B1Method for enabling access to micro-sections of integrated circuits on a waferINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 15, 2003·5 cites·19 claims
- 1055US6724479B2Method for overlay metrology of low contrast featuresINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 20, 2004·4 cites·22 claims
- 1154US8189374B2Memory device including an electrode having an outer portion with greater resistivityZAIDI SHOAIB·Filed 2010·Granted May 29, 2012·2 cites·20 claims
- 1253US7760546B2Integrated circuit including an electrode having an outer portion with greater resistivityQIMONDA NORTH AMERICA CORP·Filed 2008·Granted Jul 20, 2010·2 cites·23 claims
- 1353US7718467B2Memory deviceQIMONDA AG·Filed 2008·Granted May 18, 2010·0 cites·18 claims
- 1450US6954002B2System and method of enhancing alignment marksINFINEON TECHNOLOGIES CORP·Filed 2002·Granted Oct 11, 2005·2 cites·10 claims
- 1544US2008285912A1Integrated circuit with optical switchQIMONDA NORTH AMERICA CORP·Filed 2007·Application pending·0 cites
- 1641US7824951B2Method of fabricating an integrated circuit having a memory including a low-k dielectric materialQIMONDA AG·Filed 2008·Granted Nov 2, 2010·0 cites·9 claims
- 1739US2006077403A1Optical system and method for measuring small dimensionsZAIDI SHOAIB H·Filed 2004·Application pending·0 cites
- 1838US7388667B2Optical determination of resistivity of phase change materialsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 17, 2008·0 cites·30 claims
- 1938US2007267618A1Memory deviceZAIDI SHOAIB·Filed 2006·Application pending·0 cites
- 2037US2008012079A1Memory cell having active region sized for low reset current and method of fabricating such memory cellsZAIDI SHOAIB·Filed 2006·Application pending·0 cites
- 2136US2007178611A1Semiconductor wafer having measurement area feature for determining dielectric layer thicknessZAIDI SHOAIB·Filed 2006·Application pending·0 cites
- 2235US2007092810A1Mask-less method of forming aligned semiconductor wafer featuresZAIDI SHOAIB·Filed 2005·Application pending·0 cites
- 2334US2007249086A1Phase change memoryPHILIPP JAN B·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →