Inventor · disambiguated record
Bryan J. Robbins
Also filed as: ROBBINS BRYAN J
16 granted patents·168 citations·filing 1999–2014
92Inventor score
Top patents by PatentIndex Score
16 records- 0187US6671838B1Method and apparatus for programmable LBIST channel weightingIBM·Filed 2000·Granted Dec 30, 2003·55 cites·11 claims
- 0282US7934134B2Method and apparatus for performing logic built-in self-testing of an integrated circuitIBM·Filed 2008·Granted Apr 26, 2011·11 cites·15 claims
- 0380US8443313B2Circuit design optimizationWARD SAMUEL I·Filed 2010·Granted May 14, 2013·7 cites·24 claims
- 0472US7921346B2Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)IBM·Filed 2008·Granted Apr 5, 2011·6 cites·1 claims
- 0568US7117415B2Automated BIST test pattern sequence generator software system and methodIBM·Filed 2004·Granted Oct 3, 2006·13 cites·18 claims
- 0666US6532571B1Method to improve a testability analysis of a hierarchical designIBM·Filed 2000·Granted Mar 11, 2003·15 cites·14 claims
- 0765US9244756B1Logic-built-in-self-test diagnostic method for root cause identificationIBM·Filed 2014·Granted Jan 26, 2016·1 cites·9 claims
- 0863US6836865B2Method and apparatus for facilitating random pattern testing of logic structuresIBM·Filed 2001·Granted Dec 28, 2004·11 cites·19 claims
- 0960US6314540B1Partitioned pseudo-random logic test for improved manufacturability of semiconductor chipsIBM·Filed 1999·Granted Nov 6, 2001·24 cites·18 claims
- 1058US6751765B1Method and system for determining repeatable yield detractors of integrated circuitsIBM·Filed 2000·Granted Jun 15, 2004·10 cites·10 claims
- 1157US9244757B1Logic-built-in-self-test diagnostic method for root cause identificationIBM·Filed 2014·Granted Jan 26, 2016·0 cites·11 claims
- 1256US9274173B2Selective test pattern processorIBM·Filed 2014·Granted Mar 1, 2016·0 cites·11 claims
- 1354US9274172B2Selective test pattern processorIBM·Filed 2013·Granted Mar 1, 2016·0 cites·5 claims
- 1447US6990076B1Synchronous bi-directional data transfer having increased bandwidth and scan test featuresMCNAMARA TIMOTHY G·Filed 1999·Granted Jan 24, 2006·15 cites·17 claims
- 1542US8095837B2Method and apparatus for improving random pattern testing of logic structuresKUSKO MARY P·Filed 2008·Granted Jan 10, 2012·0 cites·18 claims
- 1641US8386230B2Circuit design optimizationIBM·Filed 2010·Granted Feb 26, 2013·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →