Inventor · disambiguated record
Hiroshi Sasai
Also filed as: SASAI HIROSHI
13 granted patents·1 pending application·176 citations·filing 1993–2017
92Inventor score
Top patents by PatentIndex Score
14 records- 0186US6926558B2Modular jackTDK CORP·Filed 2003·Granted Aug 9, 2005·43 cites·8 claims
- 0282US8164329B2Wire rope flaw detectorYOSHIOKA TAKASHI·Filed 2007·Granted Apr 24, 2012·9 cites·8 claims
- 0381US8390281B2Wire rope flaw detector for increasing accuracy independent of speed while conserving detector sizeYOSHIOKA TAKASHI·Filed 2008·Granted Mar 5, 2013·9 cites·12 claims
- 0476US7982458B2Wire-rope flaw detectorMITSUBISHI ELECTRIC CORP·Filed 2009·Granted Jul 19, 2011·4 cites·6 claims
- 0576US6690024B1Laser inspection apparatusMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 10, 2004·15 cites·12 claims
- 0675US8536861B2Wire rope flaw detectorFURUSAWA KIMIYASU·Filed 2007·Granted Sep 17, 2013·8 cites·4 claims
- 0770US8476898B2Rope tester detection plateNISHIYORI KOICHIRO·Filed 2007·Granted Jul 2, 2013·5 cites·10 claims
- 0866US5445171ASemiconductor cleaning apparatus and wafer cassetteMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Aug 29, 1995·27 cites·3 claims
- 0963US5568821ASemiconductor cleaning apparatus and wafer cassetteMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Oct 29, 1996·21 cites·7 claims
- 1054US6215386B1Coil deviceTDK CORP·Filed 1999·Granted Apr 10, 2001·16 cites·12 claims
- 1148US5551459ASemiconductor cleaning apparatus and wafer cassetteMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Sep 3, 1996·10 cites·19 claims
- 1247US5590672ASemiconductor cleaning apparatus and wafer cassetteMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 7, 1997·9 cites·14 claims
- 1345US11099138B2Detection deviceMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Aug 24, 2021·0 cites·19 claims
- 1441US2010244821A1Rope tester deviceMITSUBISHI ELECTRIC CORP·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →