Inventor · disambiguated record
Masataka Onozawa
Also filed as: ONOZAWA MASATAKA
10 granted patents·16 citations·filing 2012–2021
81Inventor score
Files withADVANTEST CORP10
Top patents by PatentIndex Score
10 records- 0181US9024648B2Handler for conveying a plurality of devices under test to a socket for a test and test apparatusADVANTEST CORP·Filed 2012·Granted May 5, 2015·6 cites·20 claims
- 0279US9453874B2Actuator, handler apparatus and test apparatusADVANTEST CORP·Filed 2014·Granted Sep 27, 2016·4 cites·13 claims
- 0379US9316686B2Handler and test apparatusADVANTEST CORP·Filed 2012·Granted Apr 19, 2016·5 cites·15 claims
- 0471US10324127B2Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing methodADVANTEST CORP·Filed 2017·Granted Jun 18, 2019·1 cites·6 claims
- 0562US11353502B2Electronic component handling apparatus and electronic component testing apparatusADVANTEST CORP·Filed 2021·Granted Jun 7, 2022·0 cites·10 claims
- 0650US9784789B2Handler apparatus that conveys a device under test to a test socket and test apparatus including the handler apparatusADVANTEST CORP·Filed 2014·Granted Oct 10, 2017·0 cites·16 claims
- 0748US11573267B1Electronic component handling apparatus and electronic component testing apparatusADVANTEST CORP·Filed 2021·Granted Feb 7, 2023·0 cites·10 claims
- 0848US9658287B2Handler apparatus, adjustment method of handler apparatus, and test apparatusADVANTEST CORP·Filed 2014·Granted May 23, 2017·0 cites·19 claims
- 0948US9606170B2Handler apparatus that conveys a device under test to a test socket and test apparatus that comprises the handler apparatusADVANTEST CORP·Filed 2014·Granted Mar 28, 2017·0 cites·9 claims
- 1035US10297043B2Detector for detecting position of IC device and method for the sameADVANTEST CORP·Filed 2017·Granted May 21, 2019·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →