Inventor · disambiguated record
Hiroyuki Tsubata
Also filed as: TSUBATA HIROYUKI
10 granted patents·2 pending applications·7 citations·filing 2011–2025
79Inventor score
Top patents by PatentIndex Score
12 records- 0171US9977069B2Non-contact discharge test method and deviceKYUSHU INST TECH·Filed 2013·Granted May 22, 2018·3 cites·12 claims
- 0269US8483978B2System and method for measuring damage lengthTSUBATA HIROYUKI·Filed 2011·Granted Jul 9, 2013·3 cites·4 claims
- 0368US10119936B2Electromagnetic field analysis method for anisotropic conductive materialFUJI HEAVY IND LTD·Filed 2017·Granted Nov 6, 2018·1 cites·18 claims
- 0459US2025237728A1Sensor position determination methodSUBARU CORP·Filed 2025·Application pending·0 cites
- 0553US12072364B2Aviation systemSUBARU CORP·Filed 2022·Granted Aug 27, 2024·0 cites·8 claims
- 0652US11650783B2Information transmission systemSUBARU CORP·Filed 2021·Granted May 16, 2023·0 cites·3 claims
- 0749US11774984B2Aircraft and flight controller for aircraftSUBARU CORP·Filed 2020·Granted Oct 3, 2023·0 cites·7 claims
- 0847US11947363B2Aircraft and flight controller for aircraftSUBARU CORP·Filed 2020·Granted Apr 2, 2024·0 cites·11 claims
- 0947US2025237687A1Analysis methodSUBARU CORP·Filed 2025·Application pending·0 cites
- 1043US9494622B2Current measurement device and current measurement methodFUJI HEAVY IND LTD·Filed 2014·Granted Nov 15, 2016·0 cites·12 claims
- 1140US11873113B2Fastening structureSUBARU CORP·Filed 2018·Granted Jan 16, 2024·0 cites·5 claims
- 1236US9805149B2Electromagnetic field analysis method for anisotropic conductive materialFUJI HEAVY IND LTD·Filed 2016·Granted Oct 31, 2017·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →