Inventor · disambiguated record
Derek C. Stoll
Also filed as: STOLL DEREK C
3 granted patents·8 citations·filing 2006–2008
62Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0170US7398172B2Method and system of providing a dynamic sampling plan for integrated metrologyIBM·Filed 2006·Granted Jul 8, 2008·5 cites·8 claims
- 0261US7509186B2Method and system for reducing the variation in film thickness on a plurality of semiconductor wafers having multiple deposition paths in a semiconductor manufacturing processIBM·Filed 2006·Granted Mar 24, 2009·2 cites·20 claims
- 0355US7577537B2Providing a dynamic sampling plan for integrated metrologyIBM·Filed 2008·Granted Aug 18, 2009·1 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →