Inventor · disambiguated record
David Vinke
Also filed as: VINKE DAVID · VINKE DAVID W
8 granted patents·65 citations·filing 2003–2008
85Inventor score
Top patents by PatentIndex Score
8 records- 0177US7640461B2On-chip circuit for transition delay fault test pattern generation with launch off shiftLSI LOGIC CORP·Filed 2007·Granted Dec 29, 2009·9 cites·12 claims
- 0276US7669155B2Generic methodology to support chip level integration of IP core instance constraints in integrated circuitsLSI CORP·Filed 2007·Granted Feb 23, 2010·11 cites·6 claims
- 0371US7233540B1Latch-based random access memory (LBRAM) with tri-state banking and contention avoidanceLSI CORP·Filed 2005·Granted Jun 19, 2007·8 cites·19 claims
- 0466US7231563B2Method and apparatus for high speed testing of latch based random access memoryLSI CORP·Filed 2004·Granted Jun 12, 2007·16 cites·16 claims
- 0565US7760578B2Enhanced power distribution in an integrated circuitLSI LOGIC CORP·Filed 2008·Granted Jul 20, 2010·7 cites·20 claims
- 0655US7152194B2Method and circuit for scan testing latch based random access memoryLSI LOGIC CORP·Filed 2003·Granted Dec 19, 2006·11 cites·13 claims
- 0754US7266021B1Latch-based random access memory (LBRAM) tri-state banking architectureLSI CORP·Filed 2005·Granted Sep 4, 2007·3 cites·20 claims
- 0842US7720556B2Web-enabled solutions for memory compilation to support pre-sales estimation of memory size, performance and power data for memory componentsLSI CORP·Filed 2005·Granted May 18, 2010·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →