Inventor · disambiguated record
Chandramouli V. Kashyap
Also filed as: KASHYAP CHANDRAMOULI V
13 granted patents·395 citations·filing 1999–2005
92Inventor score
Technology areasG06F
Files withIBM13
Top patents by PatentIndex Score
13 records- 0194US7761275B2Synthesizing current source driver model for analysis of cell characteristicsIBM·Filed 2005·Granted Jul 20, 2010·197 cites·20 claims
- 0286US7346867B2Method for estimating propagation noise based on effective capacitance in an integrated circuit chipIBM·Filed 2005·Granted Mar 18, 2008·18 cites·13 claims
- 0385US7000205B2Method, apparatus, and program for block-based static timing analysis with uncertaintyIBM·Filed 2003·Granted Feb 14, 2006·40 cites·20 claims
- 0480US6496960B1Driving point model utilizing a realizable reduced order circuit for determining a delay of a gate driving an interconnect with inductanceIBM·Filed 2000·Granted Dec 17, 2002·30 cites·23 claims
- 0575US6615395B1Method for handling coupling effects in static timing analysisIBM·Filed 1999·Granted Sep 2, 2003·72 cites·25 claims
- 0666US6434729B1Two moment RC delay metric for performance optimizationIBM·Filed 2000·Granted Aug 13, 2002·12 cites·15 claims
- 0762US7552412B2Integrated circuit (IC) chip design method, program product and systemIBM·Filed 2005·Granted Jun 23, 2009·2 cites·26 claims
- 0862US7475372B2Methods for computing Miller-factor using coupled peak noiseIBM·Filed 2005·Granted Jan 6, 2009·2 cites·11 claims
- 0961US6915496B2Apparatus and method for incorporating driver sizing into buffer insertion using a delay penalty estimation techniqueIBM·Filed 2002·Granted Jul 5, 2005·10 cites·19 claims
- 1057US6807659B2Robust delay metric for RC circuitsIBM·Filed 2002·Granted Oct 19, 2004·5 cites·15 claims
- 1153US6950996B2Interconnect delay and slew metrics based on the lognormal distributionIBM·Filed 2003·Granted Sep 27, 2005·3 cites·21 claims
- 1253US6868533B2Method and system for extending delay and slew metrics to ramp inputsIBM·Filed 2002·Granted Mar 15, 2005·3 cites·24 claims
- 1350US6968306B1Method and system for determining an interconnect delay utilizing an effective capacitance metric (ECM) signal delay modelIBM·Filed 2000·Granted Nov 22, 2005·1 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →