Inventor · disambiguated record
Hisayo Momose
Also filed as: MOMOSE HISAYO · MOMOSE HISAYO S
23 granted patents·7 pending applications·484 citations·filing 1989–2017
96Inventor score
Top patents by PatentIndex Score
30 records- 0191US5237188ASemiconductor device with nitrided gate insulating filmTOSHIBA KK·Filed 1991·Granted Aug 17, 1993·83 cites·11 claims
- 0289US5489542AMethod for fabricating semiconductor device in which threshold voltage shift and charge-pumping current are improvedTOSHIBA KK·Filed 1993·Granted Feb 6, 1996·71 cites·34 claims
- 0387US5990516AMOSFET with a thin gate insulating filmTOSHIBA KK·Filed 1995·Granted Nov 23, 1999·56 cites·14 claims
- 0487US5227855ASemiconductor memory device having a ferroelectric substance as a memory elementTOSHIBA KK·Filed 1991·Granted Jul 13, 1993·61 cites·18 claims
- 0581US8941158B2Solid-state imaging deviceIIDA YOSHINORI·Filed 2010·Granted Jan 27, 2015·3 cites·6 claims
- 0678US6410952B2MOSFET with a thin gate insulating filmTOSHIBA KK·Filed 2001·Granted Jun 25, 2002·13 cites·9 claims
- 0775US6670694B2Semiconductor deviceTOSHIBA KK·Filed 2001·Granted Dec 30, 2003·20 cites·3 claims
- 0873US7282752B2MOSFET with a thin gate insulating filmTOSHIBA KK·Filed 2005·Granted Oct 16, 2007·2 cites·19 claims
- 0971US6642560B2MOSFET with a thin gate insulating filmTOSHIBA KK·Filed 2002·Granted Nov 4, 2003·8 cites·8 claims
- 1070US9196698B2Semiconductor device having a gate dielectric film which is thinner below a source or drain electrode than below a channel regionTOSHIBA KK·Filed 2013·Granted Nov 24, 2015·3 cites·14 claims
- 1169US5898203ASemiconductor device having solid phase diffusion sourcesTOSHIBA KK·Filed 1997·Granted Apr 27, 1999·29 cites·5 claims
- 1269US5434440ASemiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 1993·Granted Jul 18, 1995·35 cites·1 claims
- 1364US9318615B2Semiconductor device and method for fabricating semiconductor deviceTOSHIBA KK·Filed 2014·Granted Apr 19, 2016·2 cites·25 claims
- 1459US6229164B1MOSFET with a thin gate insulating filmTOSHIBA KK·Filed 1999·Granted May 8, 2001·13 cites·4 claims
- 1558US5903027AMOSFET with solid phase diffusion sourceTOSHIBA KK·Filed 1997·Granted May 11, 1999·20 cites·9 claims
- 1657US2008048250A1Mosfet with a thin gate insulating filmTOSHIBA KK·Filed 2007·Application pending·0 cites
- 1755US2012235271A1Solid-state image sensing deviceMOMOSE HISAYO·Filed 2012·Application pending·0 cites
- 1851US5198692ASemiconductor device including bipolar transistor with step impurity profile having low and high concentration emitter regionsTOSHIBA KK·Filed 1991·Granted Mar 30, 1993·23 cites·9 claims
- 1950US6929990B2MOSFET with a thin gate insulating filmTOSHIBA KK·Filed 2003·Granted Aug 16, 2005·1 cites·16 claims
- 2050US5698881AMOSFET with solid phase diffusion sourceTOSHIBA KK·Filed 1994·Granted Dec 16, 1997·17 cites·5 claims
- 2146US10446651B2Oxide semiconductor, semiconductor device, semiconductor memory device, and solid-state imaging deviceTOSHIBA KK·Filed 2017·Granted Oct 15, 2019·0 cites·7 claims
- 2242US5780901ASemiconductor device with side wall conductor filmTOSHIBA KK·Filed 1995·Granted Jul 14, 1998·8 cites·11 claims
- 2339US5106782AMethod of manufacturing a semiconductor deviceTOSHIBA KK·Filed 1989·Granted Apr 21, 1992·9 cites·10 claims
- 2438US2014239289A1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2538US2014246666A1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2636US5955761ASemiconductor device and manufacturing method thereofTOSHIBA KK·Filed 1998·Granted Sep 21, 1999·4 cites·18 claims
- 2735US2016284746A1Solid-state imaging device and method for manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
- 2833US2016380115A1Thin film transistor, semiconductor device, and method for manufacturing thin film transistorTOSHIBA KK·Filed 2016·Application pending·0 cites
- 2931US5766965ASemiconductor device and method of manufacturing the sameFiled 1994·Granted Jun 16, 1998·3 cites·8 claims
- 3030US2016093742A1Semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
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