Inventor · disambiguated record
Shenzhi Yang
Also filed as: YANG SHENZHI
6 granted patents·60 citations·filing 2011–2022
75Inventor score
Top patents by PatentIndex Score
6 records- 0190US8546155B2Via chains for defect localizationD ALEO CHRISTOPHER B·Filed 2011·Granted Oct 1, 2013·58 cites·14 claims
- 0267US8787074B2Static random access memory test structurePATTERSON OLIVER D·Filed 2011·Granted Jul 22, 2014·2 cites·20 claims
- 0362US11668748B2Addressable test chipSEMITRONIX CORP·Filed 2022·Granted Jun 6, 2023·0 cites·14 claims
- 0459US10254339B2Addressable test chip test systemSEMITRONIX CORP·Filed 2017·Granted Apr 9, 2019·0 cites·19 claims
- 0555US11243251B2Addressable test system with address registerSEMITRONIX CORP·Filed 2020·Granted Feb 8, 2022·0 cites·16 claims
- 0644US9564379B2Via chains for defect localizationIBM·Filed 2013·Granted Feb 7, 2017·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →