Inventor · disambiguated record
Dustin M. Fregeau
Also filed as: FREGEAU DUSTIN · FREGEAU DUSTIN M
14 granted patents·39 citations·filing 2010–2019
88Inventor score
Technology areasG01R
Top patents by PatentIndex Score
14 records- 0193US8471575B2Methodologies and test configurations for testing thermal interface materialsFREGEAU DUSTIN·Filed 2010·Granted Jun 25, 2013·22 cites·15 claims
- 0283US8933717B2Probe-on-substrateAUDETTE DAVID M·Filed 2012·Granted Jan 13, 2015·5 cites·23 claims
- 0381US8487304B2High performance compliant wafer test probeCHEY S JAY·Filed 2010·Granted Jul 16, 2013·5 cites·23 claims
- 0475US9797928B2Probe card assemblyIBM·Filed 2014·Granted Oct 24, 2017·2 cites·18 claims
- 0573US9116200B2Methodologies and test configurations for testing thermal interface materialsIBM·Filed 2013·Granted Aug 25, 2015·2 cites·19 claims
- 0670US9057741B2Probe-on-substrateAUDETTE DAVID M·Filed 2012·Granted Jun 16, 2015·2 cites·25 claims
- 0768US11085949B2Probe card assemblyIBM·Filed 2019·Granted Aug 10, 2021·0 cites·20 claims
- 0862US8836356B2Vertical probe assembly with air channelAUDETTE DAVID M·Filed 2011·Granted Sep 16, 2014·1 cites·14 claims
- 0961US10578648B2Probe card assemblyIBM·Filed 2017·Granted Mar 3, 2020·0 cites·20 claims
- 1060US10571490B2Solder bump array probe tip structure for laser cleaningIBM·Filed 2017·Granted Feb 25, 2020·0 cites·16 claims
- 1154US9835653B2Solder bump array probe tip structure for laser cleaningIBM·Filed 2014·Granted Dec 5, 2017·0 cites·13 claims
- 1253US9086433B2Rigid probe with compliant characteristicsIBM·Filed 2012·Granted Jul 21, 2015·0 cites·15 claims
- 1353US9081034B2Rigid probe with compliant characteristicsIBM·Filed 2013·Granted Jul 14, 2015·0 cites·8 claims
- 1448US9335346B2High performance compliant wafer test probeCHEY S JAY·Filed 2012·Granted May 10, 2016·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →