Inventor · disambiguated record
Ikuko Nakatani
Also filed as: NAKATANI IKUKO
8 granted patents·10 citations·filing 2008–2020
75Inventor score
Top patents by PatentIndex Score
8 records- 0183US8198603B2Sample preparing device and sample posture shifting methodTAKAHASHI HARUO·Filed 2008·Granted Jun 12, 2012·9 cites·20 claims
- 0262US9310325B2Focused ion beam apparatus and method of working sample using the sameHITACHI HIGH TECH SCIENCE CORP·Filed 2014·Granted Apr 12, 2016·1 cites·19 claims
- 0355US11094503B2Method of preparing thin film sample piece and charged particle beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2020·Granted Aug 17, 2021·0 cites·9 claims
- 0450US9260782B2Sample preparation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Feb 16, 2016·0 cites·13 claims
- 0548US9315898B2TEM sample preparation methodHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Apr 19, 2016·0 cites·9 claims
- 0645US11199480B2Thin-sample-piece fabricating device and thin-sample-piece fabricating methodHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted Dec 14, 2021·0 cites·10 claims
- 0740US9595420B2Method for preparing lamellaHITACHI HIGH-TECH SCIENCE CORP·Filed 2012·Granted Mar 14, 2017·0 cites·11 claims
- 0837US9455119B2Charged particle beam apparatusHITACHI HIGH-TECH SCIENCE CORP·Filed 2015·Granted Sep 27, 2016·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →