Inventor · disambiguated record
Rimon Ikeno
Also filed as: IKENO RIMON
11 granted patents·2 pending applications·163 citations·filing 2001–2024
90Inventor score
Top patents by PatentIndex Score
13 records- 0192US6864708B2Suppressing the leakage current in an integrated circuitTEXAS INSTRUMENTS INC·Filed 2002·Granted Mar 8, 2005·44 cites·8 claims
- 0284US6603328B2Semiconductor integrated circuitTEXAS INSTRUMENTS INC·Filed 2001·Granted Aug 5, 2003·31 cites·12 claims
- 0382US6850103B2Low leakage single-step latch circuitTEXAS INSTRUMENTS INC·Filed 2002·Granted Feb 1, 2005·27 cites·8 claims
- 0478US6741098B2High speed semiconductor circuit having low power consumptionTEXAS INSTRUMENTS INC·Filed 2001·Granted May 25, 2004·26 cites·15 claims
- 0572US7050323B2Ferroelectric memoryTEXAS INSTRUMENTS INC·Filed 2004·Granted May 23, 2006·19 cites·17 claims
- 0659US12185010B2System, method, device and data structure for digital pixel sensorsBRILLNICS SINGAPORE PTE LTD·Filed 2021·Granted Dec 31, 2024·0 cites·19 claims
- 0758US12200384B2System, method, device and data structure for digital pixel sensorsBRILLNICS SINGAPORE PTE LTD·Filed 2021·Granted Jan 14, 2025·0 cites·18 claims
- 0855US7395307B2Carry look-ahead circuit and adder using sameTEXAS INSTRUMENTS INC·Filed 2004·Granted Jul 1, 2008·5 cites·35 claims
- 0953US2024397233A1Solid-state imaging device, method for manufacturing solid-state imaging device, and electronic apparatusBRILLNICS SINGAPORE PTE LTD·Filed 2024·Application pending·0 cites
- 1052US6778422B2Ferroelectric memoryTEXAS INSTRUMENTS INC·Filed 2002·Granted Aug 17, 2004·7 cites·17 claims
- 1143US6829321B1High speed and compact overflow detection for shiftersTEXAS INSTRUMENTS INC·Filed 2003·Granted Dec 7, 2004·4 cites·7 claims
- 1242US10088858B2Power supply apparatusADVANTEST CORP·Filed 2017·Granted Oct 2, 2018·0 cites·9 claims
- 1334US2005068059A1Suppressing the leakage current in an integrated circuitFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →