Inventor · disambiguated record

Yu-Jye Lan

Also filed as: LAN YU-JYE

1 granted patent·4 citations·filing 2004–2004

24Inventor score

Technology areasG05B

Files withTAIWAN SEMICONDUCTOR MFG1

Top patents by PatentIndex Score

1 record

0141US7127317B2System and method to analyze low yield of wafers caused by abnormal lot eventsTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Oct 24, 2006·4 cites·13 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →