Inventor · disambiguated record
Takuaki Sekiguchi
Also filed as: SEKIGUCHI TAKUAKI
6 granted patents·1 pending application·37 citations·filing 2003–2012
82Inventor score
Top patents by PatentIndex Score
7 records- 0182US7499157B2System for monitoring foreign particles, process processing apparatus and method of electronic commerceHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 3, 2009·5 cites·3 claims
- 0282US7196785B2System for monitoring foreign particles, process processing apparatus and method of electronic commerceHITACHI HIGH TECH CORP·Filed 2003·Granted Mar 27, 2007·15 cites·14 claims
- 0378US8254662B2System for monitoring foreign particles, process processing apparatus and method of electronic commerceNISHIYAMA HIDETOSHI·Filed 2011·Granted Aug 28, 2012·2 cites·14 claims
- 0476US7672799B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 2, 2010·11 cites·17 claims
- 0574US8045148B2System for monitoring foreign particles, process processing apparatus and method of electronic commerceHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 25, 2011·2 cites·8 claims
- 0661US7953567B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·36 claims
- 0739US2013100441A1Optical inspection apparatus and edge inspection deviceHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →