Inventor · disambiguated record
Shigeo Otsuki
Also filed as: OTSUKI SHIGEO
4 granted patents·15 citations·filing 2007–2020
68Inventor score
Top patents by PatentIndex Score
4 records- 0176US7672799B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 2, 2010·11 cites·17 claims
- 0266US8664588B2Mass spectrometerNODA HIROYUKI·Filed 2012·Granted Mar 4, 2014·2 cites·12 claims
- 0361US7953567B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·36 claims
- 0436US12105033B2Inspection system, determination processing apparatus, and inspection methodJGC CORP·Filed 2020·Granted Oct 1, 2024·0 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when Shigeo Otsuki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →