Inventor · disambiguated record
Shuichi Chikamatsu
Also filed as: CHIKAMATSU SHUICHI
21 granted patents·5 pending applications·405 citations·filing 1999–2012
95Inventor score
Top patents by PatentIndex Score
26 records- 0197US7098055B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2005·Granted Aug 29, 2006·36 cites·7 claims
- 0296US7940383B2Method of detecting defects on an objectHITACHI LTD·Filed 2009·Granted May 10, 2011·42 cites·20 claims
- 0396US7639350B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Dec 29, 2009·25 cites·20 claims
- 0496US6411377B1Optical apparatus for defect and particle size inspectionHITACHI LTD·Filed 1999·Granted Jun 25, 2002·174 cites·29 claims
- 0593US8319960B2Defect inspection systemAIKO KENJI·Filed 2010·Granted Nov 27, 2012·19 cites·12 claims
- 0693US7443496B2Apparatus and method for testing defectsHITACHI LTD·Filed 2007·Granted Oct 28, 2008·16 cites·15 claims
- 0792US7037735B2Apparatus and method for testing defectsHITACHI HIGH TECH CORP·Filed 2002·Granted May 2, 2006·43 cites·18 claims
- 0891US7692779B2Apparatus and method for testing defectsHITACHI LTD·Filed 2005·Granted Apr 6, 2010·12 cites·20 claims
- 0991US7535561B2Defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted May 19, 2009·14 cites·2 claims
- 1076US7733475B2Defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Jun 8, 2010·3 cites·4 claims
- 1176US7672799B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 2, 2010·11 cites·17 claims
- 1275US8804109B2Defect inspection systemHITACHI HIGH TECH CORP·Filed 2012·Granted Aug 12, 2014·2 cites·6 claims
- 1374US7733474B2Defect inspection systemHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 8, 2010·3 cites·14 claims
- 1470US7847927B2Defect inspection method and defect inspection apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 7, 2010·2 cites·7 claims
- 1561US7953567B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·36 claims
- 1658US7847928B2Inspection device and inspection methodHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 7, 2010·0 cites·16 claims
- 1756US2013033705A1Inspection device and inspection methodHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 1855US8102522B2Inspection apparatus and inspection methodSUGA TADASHI·Filed 2007·Granted Jan 24, 2012·1 cites·11 claims
- 1954US8314930B2Inspection device and inspection methodTANIGUCHI KOICHI·Filed 2010·Granted Nov 20, 2012·0 cites·11 claims
- 2051US8134701B2Defect inspecting method and apparatusCHIKAMATSU SHUICHI·Filed 2010·Granted Mar 13, 2012·0 cites·5 claims
- 2150US8345233B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2011·Granted Jan 1, 2013·0 cites·5 claims
- 2250US2009059216A1Defect inspection method and defect inspection apparatusSHIBATA YUKIHIRO·Filed 2008·Application pending·0 cites
- 2349US2008297786A1Inspecting device and inspecting methodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 2447US8228496B2Defect inspection method and defect inspection apparatusCHIKAMATSU SHUICHI·Filed 2010·Granted Jul 24, 2012·0 cites·11 claims
- 2547US2011141463A1Defect inspection method, and defect inspection deviceCHIKAMATSU SHUICHI·Filed 2009·Application pending·0 cites
- 2642US2013194579A1Inspection apparatusMOHARA YUKIHISA·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Shuichi Chikamatsu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →