Inventor · disambiguated record
Jorg Kiesewetter
Also filed as: KIESEWETTER JOERG · KIESEWETTER JORG · KIESEWETTER JÖRG
13 granted patents·9 pending applications·79 citations·filing 2002–2016
91Inventor score
Files withSUSS MICROTEC TEST SYS GMBH10SUSS MICROTEC TESTSYSTEMS GMBH3CASCADE MICROTECH INC2KANEV STOJAN1SCHNEIDEWIND STEFAN1
Top patents by PatentIndex Score
22 records- 0180US8240650B2Chuck with triaxial constructionTEICH MICHAEL·Filed 2008·Granted Aug 14, 2012·8 cites·16 claims
- 0280US7733108B2Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 8, 2010·9 cites·14 claims
- 0376US7579849B2Probe holder for a probe for testing semiconductor componentsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·8 cites·11 claims
- 0469US7671615B2Method and apparatus for controlling the temperature of electronic componentsSUSS MICROTEC TECH SYSTEMS GMB·Filed 2007·Granted Mar 2, 2010·6 cites·25 claims
- 0568US7046025B2Test apparatus for testing substrates at low temperaturesSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2003·Granted May 16, 2006·13 cites·10 claims
- 0665US8094925B2Method for increasing the accuracy of the positioning of a first object relative to a second objectSCHNEIDEWIND STEFAN·Filed 2009·Granted Jan 10, 2012·5 cites·5 claims
- 0762US7579854B2Probe station and method for measurements of semiconductor devices under defined atmosphereSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·4 cites·21 claims
- 0862US7057408B2Method and prober for contacting a contact area with a contact tipSUSS MICROTEC TEST SYS GMBH·Filed 2004·Granted Jun 6, 2006·11 cites·13 claims
- 0959US7659743B2Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a waferSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Feb 9, 2010·3 cites·7 claims
- 1055US7038441B2Test apparatus with loading deviceSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2003·Granted May 2, 2006·7 cites·20 claims
- 1151US8368413B2Method for testing electronic components of a repetitive pattern under defined thermal conditionsKANEV STOJAN·Filed 2009·Granted Feb 5, 2013·2 cites·12 claims
- 1251US2010045265A1Method and device for forming a temporary electrical contact to a solar cellSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 1350US7573283B2Method for measurement of a device under testSUSS MICRO TEC TEST SYSTEMS GM·Filed 2007·Granted Aug 11, 2009·3 cites·15 claims
- 1446US2009049944A1Micromanipulator for moving a probeSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 1543US2014184003A1Systems and methods for rotational alignment of a device under testCASCADE MICROTECH INC·Filed 2013·Application pending·0 cites
- 1643US2009021275A1Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
- 1738US2010045264A1Probe for temporarily electrically contacting a solar cellSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 1838US2004208355A1Method for increasing the accuracy of the positioning of a first object relative to a second objectFiled 2004·Application pending·0 cites
- 1937US2007064992A1Process for the inspection of a variety of repetitive structuresSUSS MICROTEC TEST SYS GMBH·Filed 2006·Application pending·0 cites
- 2034US6864676B2Substrate-holding device for testing circuit arrangements on substratesSUSS MICROTEC TESTSYSTEMS GMBH·Filed 2002·Granted Mar 8, 2005·0 cites·10 claims
- 2134US2004119492A1Method and apparatus for testing movement-sensitive substratesFiled 2003·Application pending·0 cites
- 2227US2017248973A1Probe systems and methods including active environmental controlCASCADE MICROTECH INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →