Inventor · disambiguated record
Gokhan Percin
Also filed as: PERCIN GOEKHAN · PERCIN GOKHAN
12 granted patents·1 pending application·558 citations·filing 1998–2012
94Inventor score
Files withCADENCE DESIGN SYSTEMS INC3INVARIUM INC3UNIV LELAND STANFORD JUNIOR3ADLER STEVEN J1SEZGINER ABDURRAHMAN1
Top patents by PatentIndex Score
13 records- 0197US8222065B1Method and system for forming a capacitive micromachined ultrasonic transducerSMEYS PETER·Filed 2009·Granted Jul 17, 2012·90 cites·20 claims
- 0296US8563345B2Integration of structurally-stable isolated capacitive micromachined ultrasonic transducer (CMUT) array cells and array elementsADLER STEVEN J·Filed 2012·Granted Oct 22, 2013·72 cites·15 claims
- 0396US6474786B2Micromachined two-dimensional array droplet ejectorsUNIV LELAND STANFORD JUNIOR·Filed 2001·Granted Nov 5, 2002·91 cites·26 claims
- 0495US7600212B2Method of compensating photomask data for the effects of etch and lithography processesCADENCE DESIGN SYSTEMS INC·Filed 2006·Granted Oct 6, 2009·39 cites·55 claims
- 0595US6445109B2Micromachined two dimensional array of piezoelectrically actuated flextensional transducersUNIV LELAND STANFORD JUNIOR·Filed 2001·Granted Sep 3, 2002·80 cites·8 claims
- 0694US7444615B2Calibration on wafer sweet spotsINVARIUM INC·Filed 2005·Granted Oct 28, 2008·25 cites·25 claims
- 0792US6291927B1Micromachined two dimensional array of piezoelectrically actuated flextensional transducersUNIV LELAND STANFORD JUNIOR·Filed 1998·Granted Sep 18, 2001·66 cites·11 claims
- 0891US8279409B1System and method for calibrating a lithography modelSEZGINER ABDURRAHMAN·Filed 2009·Granted Oct 2, 2012·45 cites·15 claims
- 0990US7392502B2Method for real time monitoring and verifying optical proximity correction model and methodINVARIUM INC·Filed 2005·Granted Jun 24, 2008·16 cites·20 claims
- 1086US7536670B2Method for verifying and choosing lithography modelCADENCE DESIGN SYSTEMS INC·Filed 2005·Granted May 19, 2009·11 cites·21 claims
- 1181US7588868B2Method and system for reducing the impact of across-wafer variations on critical dimension measurementsCADENCE DESIGN SYSTEMS INC·Filed 2004·Granted Sep 15, 2009·18 cites·42 claims
- 1278US7224437B2Method for measuring and verifying stepper illuminationINVARIUM INC·Filed 2005·Granted May 29, 2007·5 cites·28 claims
- 1343US2003005771A1Two-dimensional array of ultrasonic sensors for high throughput fluid screeningFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →