Inventor · disambiguated record
Bryon K. Hance
Also filed as: HANCE BRYON K
5 granted patents·59 citations·filing 1999–2012
76Inventor score
Top patents by PatentIndex Score
5 records- 0167US6574359B1Method and apparatus for inspecting wafer defectsADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 3, 2003·10 cites·19 claims
- 0266US6507933B1Automatic defect source classificationADVANCED MICRO DEVICES INC·Filed 1999·Granted Jan 14, 2003·46 cites·46 claims
- 0354US8171627B2Method of forming an electronic deviceHANCE BRYON K·Filed 2007·Granted May 8, 2012·1 cites·16 claims
- 0446US6524869B1Method and apparatus for detecting ion implant induced defectsADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 25, 2003·2 cites·37 claims
- 0544US8643083B2Electronic devices with ultraviolet blocking layersHANCE BRYON K·Filed 2012·Granted Feb 4, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →