Inventor · disambiguated record
Toshiyuki Morishita
Also filed as: MORISHITA TOSHIYUKI
38 granted patents·7 pending applications·659 citations·filing 1996–2023
98Inventor score
Top patents by PatentIndex Score
45 records- 0194US6525375B1Semiconductor device having trench filled up with gate electrodeDENSO CORP·Filed 2000·Granted Feb 25, 2003·79 cites·61 claims
- 0292US8023698B2Information device operation apparatusDENSO CORP·Filed 2008·Granted Sep 20, 2011·55 cites·26 claims
- 0392US7732821B2Silicon carbide semiconductor deviceDENSO CORP·Filed 2008·Granted Jun 8, 2010·20 cites·20 claims
- 0491US6495883B2Trench gate type semiconductor device and method of manufacturingDENSO CORP·Filed 2002·Granted Dec 17, 2002·62 cites·19 claims
- 0589US7855384B2SIC semiconductor device and method for manufacturing the sameDENSO CORP·Filed 2007·Granted Dec 21, 2010·21 cites·14 claims
- 0689US6118152ASemiconductor device and method of manufacturing the sameDENSO CORP·Filed 1998·Granted Sep 12, 2000·104 cites·27 claims
- 0787US7073331B2Steam engineDENSO CORP·Filed 2005·Granted Jul 11, 2006·15 cites·18 claims
- 0887US6630389B2Method for manufacturing semiconductor deviceDENSO CORP·Filed 2002·Granted Oct 7, 2003·37 cites·14 claims
- 0986US7424802B2Steam engineDENSO CORP·Filed 2005·Granted Sep 16, 2008·12 cites·8 claims
- 1086US7185491B2Steam engineDENSO CORP·Filed 2005·Granted Mar 6, 2007·13 cites·19 claims
- 1185US6696323B2Method of manufacturing semiconductor device having trench filled up with gate electrodeDENSO CORP·Filed 2003·Granted Feb 24, 2004·32 cites·9 claims
- 1284US5777365ASemiconductor device having a silicon-on-insulator structureNIPPON DENSO CO·Filed 1996·Granted Jul 7, 1998·75 cites·19 claims
- 1381US7763504B2Method for manufacturing silicon carbide semiconductor deviceDENSO CORP·Filed 2008·Granted Jul 27, 2010·8 cites·21 claims
- 1481US6973788B2Steam engineDENSO CORP·Filed 2005·Granted Dec 13, 2005·8 cites·24 claims
- 1580US6855981B2Silicon carbide power device having protective diodeDENSO CORP·Filed 2002·Granted Feb 15, 2005·27 cites·20 claims
- 1678US6710435B2Semiconductor device arrangement and method of fabricating the sameDENSO CORP·Filed 2002·Granted Mar 23, 2004·26 cites·22 claims
- 1775US7230283B2Semiconductor device having a metal conductor in ohmic contact with the gate region on the bottom of each grooveDENSO CORP·Filed 2005·Granted Jun 12, 2007·5 cites·11 claims
- 1874US7355207B2Silicon carbide semiconductor device and method for manufacturing the sameDENSO CORP·Filed 2005·Granted Apr 8, 2008·5 cites·8 claims
- 1973US8084011B2Method and apparatus for manufacturing carbon nanotubeSUZUKI YOSHINOBU·Filed 2007·Granted Dec 27, 2011·4 cites·20 claims
- 2073US7532404B2Optical device having micro lens arrayDENSO CORP·Filed 2006·Granted May 12, 2009·2 cites·19 claims
- 2173US7493751B2External combustion engineDENSO CORP·Filed 2007·Granted Feb 24, 2009·4 cites·23 claims
- 2270US11152185B2Electron source and production method thereforDENKA COMPANY LTD·Filed 2021·Granted Oct 19, 2021·0 cites·11 claims
- 2370US7268677B2Information processing systemDENSO CORP·Filed 2005·Granted Sep 11, 2007·5 cites·42 claims
- 2469US8456076B2Electron emitting source and manufacturing method of electron emitting sourceMORISHITA TOSHIYUKI·Filed 2008·Granted Jun 4, 2013·2 cites·3 claims
- 2568US7799588B2Method of manufacturing the optical device by a stopper to form an oxide blockDENSO CORP·Filed 2007·Granted Sep 21, 2010·5 cites·42 claims
- 2668US7335928B2Semiconductor device having a metal conductor in ohmic contact with the gate region on the bottom of each the first grooveHITACHI LTD·Filed 2007·Granted Feb 26, 2008·3 cites·4 claims
- 2768US7129176B2Optical device having micro lens array and method for manufacturing the sameDENSO CORP·Filed 2004·Granted Oct 31, 2006·11 cites·17 claims
- 2867US6938473B2Apparatus for measuring flow amountDENSO CORP·Filed 2002·Granted Sep 6, 2005·17 cites·32 claims
- 2966US9496673B2Enclosure and method for handling electron gun or ion gunMORISHITA TOSHIYUKI·Filed 2012·Granted Nov 15, 2016·2 cites·12 claims
- 3064US10957511B2Electron source and production method thereforDENKA COMPANY LTD·Filed 2019·Granted Mar 23, 2021·0 cites·12 claims
- 3159US9034721B2Method for manufacturing semiconductor substrateSUMCO CORP·Filed 2014·Granted May 19, 2015·0 cites·2 claims
- 3259US8956947B2Method for manufacturing semiconductor substrateSUMCO CORP·Filed 2014·Granted Feb 17, 2015·0 cites·9 claims
- 3357US10553390B2Electron source and production method thereforDENKA COMPANY LTD·Filed 2017·Granted Feb 4, 2020·0 cites·11 claims
- 3457US7905090B2Steam engineDENSO CORP·Filed 2008·Granted Mar 15, 2011·0 cites·8 claims
- 3549US2009213951A1Method of suppressing carrier leak in OFDM transmission and radio transmitter using same methodDENSO CORP·Filed 2009·Application pending·0 cites
- 3649US2009273102A1Semiconductor Substrate and Method for Manufacturing the SameNOGAMI SYOUJI·Filed 2006·Application pending·0 cites
- 3748US12190273B2Work content analyzing apparatus, work content analyzing method, program, and sensorTOSHIBA DIGITAL SOLUTIONS CORP·Filed 2021·Granted Jan 7, 2025·0 cites·20 claims
- 3848US8835276B2Method for manufacturing semiconductor substrateNOGAMI SYOUJI·Filed 2010·Granted Sep 16, 2014·0 cites·2 claims
- 3946US8936666B2Adsorption agent for noble metal, method for manufacturing the same, and method for recovering noble metalKATO HISAYA·Filed 2011·Granted Jan 20, 2015·0 cites·4 claims
- 4044US2023186211A1Work content analysis apparatus, work content analysis method, and programTOSHIBA DIGITAL SOLUTIONS CORP·Filed 2023·Application pending·0 cites
- 4143US8593048B2Electron source having a tungsten single crystal electrodeNONOGAKI RYOZO·Filed 2010·Granted Nov 26, 2013·0 cites·4 claims
- 4243US2008054217A1Heat transport fluid, heat transport structure, and heat transport methodDENSO CORP·Filed 2007·Application pending·0 cites
- 4341US2006106615A1Speech interaction apparatus and speech interaction methodDENSO CORP·Filed 2005·Application pending·0 cites
- 4437US2008078975A1Heat transport mediumKAWAGUCHI TOURU·Filed 2007·Application pending·0 cites
- 4537US2012169210A1Electron-source rod, electron source and electronic deviceMORISHITA TOSHIYUKI·Filed 2010·Application pending·0 cites
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