Inventor · disambiguated record
Akihiro Chiyonobu
Also filed as: CHIYONOBU AKIHIRO
3 granted patents·4 citations·filing 2015–2016
55Inventor score
Files withFUJITSU LTD3
Top patents by PatentIndex Score
3 records- 0174US9797949B2Test circuit and method of controlling test circuitFUJITSU LTD·Filed 2015·Granted Oct 24, 2017·2 cites·15 claims
- 0266US9691740B2Stacked semiconductor device and method of controlling thereofFUJITSU LTD·Filed 2016·Granted Jun 27, 2017·2 cites·8 claims
- 0332US9835685B2Test circuit and method for controlling test circuitFUJITSU LTD·Filed 2015·Granted Dec 5, 2017·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →