Inventor · disambiguated record
David D. Sieloff
Also filed as: SIELOFF DAVID D
2 granted patents·2 citations·filing 2005–2007
35Inventor score
Files withFREESCALE SEMICONDUCTOR INC2
Top patents by PatentIndex Score
2 records- 0143US7579590B2Method of measuring thin layers using SIMSFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Aug 25, 2009·2 cites·20 claims
- 0234US7527976B2Processes for testing a region for an analyte and a process for forming an electronic deviceFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted May 5, 2009·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →