Inventor · disambiguated record
Robert D. Patrie
Also filed as: PATRIE ROBERT D
17 granted patents·675 citations·filing 1998–2004
96Inventor score
Technology areasG01R
Files withXILINX INC17
Top patents by PatentIndex Score
17 records- 0193US6539508B1Methods and circuits for testing programmable logicXILINX INC·Filed 2000·Granted Mar 25, 2003·66 cites·32 claims
- 0292US6817006B1Application-specific testing methods for programmable logic devicesXILINX INC·Filed 2002·Granted Nov 9, 2004·51 cites·25 claims
- 0391US6891395B2Application-specific testing methods for programmable logic devicesXILINX INC·Filed 2004·Granted May 10, 2005·43 cites·16 claims
- 0491US6356514B1Built-in self test method for measuring clock to out delaysXILINX INC·Filed 2001·Granted Mar 12, 2002·40 cites·13 claims
- 0591US6219305B1Method and system for measuring signal propagation delays using ring oscillatorsXILINX INC·Filed 1998·Granted Apr 17, 2001·91 cites·32 claims
- 0688US6233205B1Built-in self test method for measuring clock to out delaysXILINX INC·Filed 1998·Granted May 15, 2001·57 cites·13 claims
- 0786US6594610B1Fault emulation testing of programmable logic devicesXILINX INC·Filed 2001·Granted Jul 15, 2003·36 cites·24 claims
- 0883US6466520B1Built-in AC self test using pulse generatorsXILINX INC·Filed 1999·Granted Oct 15, 2002·48 cites·16 claims
- 0983US6232845B1Circuit for measuring signal delays in synchronous memory elementsXILINX INC·Filed 1999·Granted May 15, 2001·49 cites·22 claims
- 1083US6075418ASystem with downstream set or clear for measuring signal propagation delays on integrated circuitsXILINX INC·Filed 1999·Granted Jun 13, 2000·49 cites·21 claims
- 1182US6611477B1Built-in self test using pulse generatorsXILINX INC·Filed 2002·Granted Aug 26, 2003·25 cites·17 claims
- 1280US7007250B1Application-specific methods useful for testing look up tables in programmable logic devicesXILINX INC·Filed 2003·Granted Feb 28, 2006·20 cites·19 claims
- 1378US6651238B1Providing fault coverage of interconnect in an FPGAXILINX INC·Filed 2001·Granted Nov 18, 2003·23 cites·20 claims
- 1476US6069849AMethod and system for measuring signal propagation delays using the duty cycle of a ring oscillatorXILINX INC·Filed 1998·Granted May 30, 2000·37 cites·14 claims
- 1573US7127697B1Methods of utilizing programmable logic devices having localized defects in application-specific productsXILINX INC·Filed 2003·Granted Oct 24, 2006·15 cites·14 claims
- 1670US7219314B1Application-specific methods for testing molectronic or nanoscale devicesXILINX INC·Filed 2004·Granted May 15, 2007·14 cites·17 claims
- 1761US6594797B1Methods and circuits for precise edge placement of test signalsXILINX INC·Filed 2000·Granted Jul 15, 2003·11 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →