Inventor · disambiguated record
Jung-Taik Cheong
Also filed as: CHEONG JUNG-TAIK
11 granted patents·4 pending applications·88 citations·filing 2003–2017
89Inventor score
Top patents by PatentIndex Score
15 records- 0194US9837490B2Semiconductor device with air gap and method for fabricating the sameSK HYNIX INC·Filed 2016·Granted Dec 5, 2017·18 cites·10 claims
- 0294US7256129B2Method for fabricating semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Aug 14, 2007·32 cites·15 claims
- 0385US8748958B1Phase-change random access memory device and method of manufacturing the sameSK HYNIX INC·Filed 2013·Granted Jun 10, 2014·7 cites·15 claims
- 0484US8916847B2Variable resistance memory device and method for fabricating the sameSK HYNIX INC·Filed 2012·Granted Dec 23, 2014·5 cites·12 claims
- 0582US8198626B2Reference wafer for calibration and method for fabricating the sameLEE HYUN-CHUL·Filed 2009·Granted Jun 12, 2012·11 cites·7 claims
- 0675US10490446B2Semiconductor device with air gap and method for fabricating the sameSK HYNIX INC·Filed 2017·Granted Nov 26, 2019·2 cites·19 claims
- 0765US7518175B2Semiconductor memory device and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 14, 2009·2 cites·16 claims
- 0855US7192825B2Semiconductor memory device and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Mar 20, 2007·5 cites·7 claims
- 0953US6924229B2Method for forming a semiconductor device with a hard mask layer formed over a bit line to protect the bit line during subsequent etching stepsHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Aug 2, 2005·6 cites·6 claims
- 1051US7504296B2Semiconductor memory device and method for fabricating the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 17, 2009·0 cites·8 claims
- 1147US7723239B2Method for fabricating capacitor in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 25, 2010·0 cites·12 claims
- 1244US2012217219A1Reference wafer for calibration and method for fabricating the sameLEE HYUN-CHUL·Filed 2012·Application pending·0 cites
- 1343US2010124811A1Method for fabricating capacitor in semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 1439US2007202704A1Method for etching platinum and method for fabricating capacitor using the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 1538US2013313664A1Resistive memory device and fabrication method thereofJUNG HA CHANG·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →