Inventor · disambiguated record
Gonzalo Roberto Sanguinetti
Also filed as: SANGUINETTI GONZALO ROBERTO
7 granted patents·1 pending application·4 citations·filing 2018–2022
74Inventor score
Files withASML NETHERLANDS BV8
Top patents by PatentIndex Score
8 records- 0188US10859923B2Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2020·Granted Dec 8, 2020·2 cites·12 claims
- 0272US10564552B2Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Feb 18, 2020·1 cites·20 claims
- 0370US10705430B2Method of measuring a parameter of interest, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2018·Granted Jul 7, 2020·1 cites·20 claims
- 0467US11448974B2Metrology parameter determination and metrology recipe selectionASML NETHERLANDS BV·Filed 2021·Granted Sep 20, 2022·0 cites·22 claims
- 0566US11604419B2Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targetsASML NETHERLANDS BV·Filed 2021·Granted Mar 14, 2023·0 cites·20 claims
- 0657US10990020B2Metrology parameter determination and metrology recipe selectionASML NETHERLANDS BV·Filed 2018·Granted Apr 27, 2021·0 cites·23 claims
- 0756US11022897B2Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targetsASML NETHERLANDS BV·Filed 2018·Granted Jun 1, 2021·0 cites·20 claims
- 0850US2025021021A1Metrology calibration methodASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →