Inventor · disambiguated record
Olger Victor Zwier
Also filed as: ZWIER OLGER VICTOR
10 granted patents·2 pending applications·16 citations·filing 2018–2023
82Inventor score
Files withASML NETHERLANDS BV12
Top patents by PatentIndex Score
12 records- 0194US11385553B2Metrology method, patterning device, apparatus and computer programASML NETHERLANDS BV·Filed 2021·Granted Jul 12, 2022·2 cites·20 claims
- 0293US10606178B2Method of measuring a target, and metrology apparatusASML NETHERLANDS BV·Filed 2019·Granted Mar 31, 2020·10 cites·20 claims
- 0389US12276921B2Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology methodASML NETHERLANDS BV·Filed 2021·Granted Apr 15, 2025·2 cites·17 claims
- 0486US10996570B2Metrology method, patterning device, apparatus and computer programASML NETHERLANDS BV·Filed 2019·Granted May 4, 2021·2 cites·25 claims
- 0569US12242203B2Target for measuring a parameter of a lithographic processASML NETHERLANDS BV·Filed 2021·Granted Mar 4, 2025·0 cites·11 claims
- 0667US11448974B2Metrology parameter determination and metrology recipe selectionASML NETHERLANDS BV·Filed 2021·Granted Sep 20, 2022·0 cites·22 claims
- 0765US12013647B2Metrology methodASML NETHERLANDS BV·Filed 2019·Granted Jun 18, 2024·0 cites·12 claims
- 0863US2025348008A1Single pad overlay measurementASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0961US2025362617A1Metrology method and associated metrology deviceASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1057US10990020B2Metrology parameter determination and metrology recipe selectionASML NETHERLANDS BV·Filed 2018·Granted Apr 27, 2021·0 cites·23 claims
- 1155US11982946B2Metrology targetsASML NETHERLANDS BV·Filed 2020·Granted May 14, 2024·0 cites·20 claims
- 1247US12019377B2Target for measuring a parameter of a lithographic processASML NETHERLANDS BV·Filed 2019·Granted Jun 25, 2024·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →